X-ray Crystal Truncation Rod Studies of Surface Oxidation and Reduction on Pt(111)

Liu, Yihua; Barbour, Andi; Komanicky, Vladimir; You, Hoydoo

doi:10.1021/acs.jpcc.6b00492

Cited by 49 publications

(64 citation statements)

References 30 publications

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“…It was found that the surface oxide forms in three distinctive steps. First, oxispecies adsorb to the surface with little effect structurally and chemically on the platinum surface . Second, at a high anodic potential, platinum atoms place‐exchange with oxygen atoms to form a bi‐layer oxide surface .…”

Section: Electrode Interface Studies With Conventional Surface X‐ray mentioning

confidence: 98%

X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics

You

2018

The Chemical Record

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We will review structures and dynamics of electrode interfaces studied in situ using x‐ray scattering and imaging techniques. The examples cover single‐crystal and nanocrystal structures relevant to electrocatalytic activities, anodic oxidation and corrosion, aqueous dissolution reactions, surface reconstructions, and surface modifications by under potential deposition. The x‐ray techniques include the widely used traditional surface x‐ray scattering, such as crystal truncation rods and x‐ray reflectivity, as well as recently developed resonance surface scattering, coherent surface x‐ray photon correlation spectroscopy, coherent x‐ray Bragg diffraction imaging, and surface ptychography. Results relevant to various electrochemical phenomena will be highlighted.

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Section: Electrode Interface Studies With Conventional Surface X‐ray mentioning

confidence: 98%

X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics

You

2018

The Chemical Record

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“…A survey of recent high‐resolution CTR results using model refinement, direct methods, and hybrid approaches shows that the estimated uncertainty in the relative atomic positions (along the surface normal) is generally less than 0.1 Å (10 pm), the uncertainty in the occupancies is on the order or ≈5–10%, and bond/tilt angles can be determined with a precision a few degrees. [ 1,31,93–100 ]…”

Section: Theory and Measurement Of Ctrsmentioning

confidence: 99%

“…[93] A survey of recent high-resolution CTR results using model refinement, direct methods, and hybrid approaches shows that the estimated uncertainty in the relative atomic positions (along the surface normal) is generally less than 0.1 Å (10 pm), the uncertainty in the occupancies is on the order or ≈5-10%, and bond/tilt angles can be determined with a precision a few degrees. [1,31,[93][94][95][96][97][98][99][100] It should be noted that, for a full reconstruction of the electron density from CTR data, it is challenging to apply current phase retrieval techniques for more than ≈10-15 unknown surface or film layers. Therefore, the application of direct methods has been restricted to surface and thin film structures, while larger structures such as periodic superlattices have been analyzed via model refinement.…”

Section: Resolution Uncertainty and Limitationsmentioning

confidence: 99%

High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces

Disa

Walker

Ahn

2020

Adv Materials Inter

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In crystalline materials, the presence of surfaces or interfaces gives rise to crystal truncation rods (CTRs) in their X‐ray diffraction patterns. While structural properties related to the bulk of a crystal are contained in the intensity and position of Bragg peaks in X‐ray diffraction, CTRs carry detailed information about the atomic structure at the interface. Developments in synchrotron X‐ray sources, instrumentation, and analysis procedures have made CTR measurements into extremely powerful tools to study atomic reconstructions and relaxations occurring in a wide variety of interfacial systems, with relevance to chemical and electronic functionalities. In this review, an overview of the use of CTRs in the study of atomic structure at interfaces is provided. The basic theory, measurement, and analysis of CTRs are covered and applications from the literature are highlighted. Illustrative examples include studies of complex oxide thin films and multilayers.

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“…This way, secondary electrons are released from the Si surface, which can interact with the adsorbed DNA. Liu et al [22] performed LEE impact studies on plasmid DNA by generating the LEEs from the substrate surface through UV irradiation. 240-400 nm (3.1-5.2 eV) VUV irradiations of the n-Si substrates resulted in a significant amount of SSBs in the plasmid DNA.…”

Section: Introductionmentioning

confidence: 99%

“…240-400 nm (3.1-5.2 eV) VUV irradiations of the n-Si substrates resulted in a significant amount of SSBs in the plasmid DNA. [22] 1.1. Methods…”

Section: Introductionmentioning

confidence: 99%

Vacuum‐UV and Low‐Energy Electron‐Induced DNA Strand Breaks – Influence of the DNA Sequence and Substrate

et al. 2019

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DNA is effectively damaged by radiation, which can on the one hand lead to cancer and is on the other hand directly exploited in the treatment of tumor tissue. DNA strand breaks are already induced by photons having an energy below the ionization energy of DNA. At high photon energies, most of the DNA strand breaks are induced by low‐energy secondary electrons. In the present study we quantified photon and electron induced DNA strand breaks in four different 12mer oligonucleotides. They are irradiated directly with 8.44 eV vacuum ultraviolet (VUV) photons and 8.8 eV low energy electrons (LEE). By using Si instead of VUV transparent CaF2 as a substrate the VUV exposure leads to an additional release of LEEs, which have a maximum energy of 3.6 eV and can significantly enhance strand break cross sections. Atomic force microscopy is used to visualize strand breaks on DNA origami platforms and to determine absolute values for the strand break cross sections. Upon irradiation with 8.44 eV photons all the investigated sequences show very similar strand break cross sections in the range of 1.7–2.3×10−16 cm2. The strand break cross sections for LEE irradiation at 8.8 eV are one to two orders of magnitude larger than the ones for VUV photons, and a slight sequence dependence is observed. The sequence dependence is even more pronounced for LEEs with energies <3.6 eV. The present results help to assess DNA damage by photons and electrons close to the ionization threshold.

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X-ray Crystal Truncation Rod Studies of Surface Oxidation and Reduction on Pt(111)

Cited by 49 publications

References 30 publications

X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics

X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics

High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces

Vacuum‐UV and Low‐Energy Electron‐Induced DNA Strand Breaks – Influence of the DNA Sequence and Substrate

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