2019
DOI: 10.1007/978-981-10-4912-5_19-1
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X-Ray Computed Tomography for Dimensional Metrology

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Cited by 2 publications
(2 citation statements)
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“…Nondestructive testing technology, particularly industrial computed tomography (CT), holds significance in detecting internal defects and precisely measuring internal structures [6][7][8][9][10][11][12]. Schock et al [13] suggested a combination of high-resolution dual-energy X-ray micro-CT with subsequent advanced image processing steps to derive characteristic parameters for describing real porous systems.…”
Section: Introductionmentioning
confidence: 99%
“…Nondestructive testing technology, particularly industrial computed tomography (CT), holds significance in detecting internal defects and precisely measuring internal structures [6][7][8][9][10][11][12]. Schock et al [13] suggested a combination of high-resolution dual-energy X-ray micro-CT with subsequent advanced image processing steps to derive characteristic parameters for describing real porous systems.…”
Section: Introductionmentioning
confidence: 99%
“…X-ray CT is an optimal technique to provide dimensional metrology of complex small-scale structures, such as those produced by additive manufacturing, due to its capability to nondestructively measure internal features and multimaterial components [9,10,13,14]. X-ray CT is mainly used in the following fields: medical imaging, material analysis, and recently dimensional metrology [9,10,13,[15][16][17][18][19]. However, the use of X-ray CT in manufacturing metrology has been limited due (1) to a lack of international standards for metrological testing and uncertainty assessment [13] and (2) an often significant and poorly understood level of variability in the metrology results at the micro/ nanoscale.…”
Section: Introductionmentioning
confidence: 99%