X-ray backscattering (diffraction at a Bragg angle of π/2): A review

Лидер, В. В.

doi:10.1134/s1063774512050094

Cited by 2 publications

(2 citation statements)

References 126 publications

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“…Among the large number of X-ray diffraction methods, one can distinguish the diffraction method at 2 angles of the order of (Shvydko, 2004;Lider, 2012).…”

Section: Introductionmentioning

confidence: 99%

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Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

et al. 2020

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This article presents measurements of the piezoelectric modulus d 11 of a single crystal of lanthanum gallium silicate (LGS, La 3 Ga 5 SiO 14 ). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative changes in the lattice constant in crystals caused by external influences (constant or alternating electric field, mechanical load, temperature change etc.). The development opportunity of the technique is shown, its applicability is evaluated and results of measurement of the LGS single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near are discussed.

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“…Among the large number of X-ray diffraction methods, one can distinguish the diffraction method at 2 angles of the order of (Shvydko, 2004;Lider, 2012).…”

Section: Introductionmentioning

confidence: 99%

“…Great opportunities are provided by the well developed but very difficult to implement method of registering diffracted beams at angles close to or even equal to backscattering. This method is characterized by high sensitivity to deformation of the unit cell at the level Ád/d ' 10 À6 -10 À7 (Lider, 2012).…”

Section: Introductionmentioning

confidence: 99%

Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

et al. 2020

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Precise determination of crystal lattice parameters

Лидер¹

2020

Phys.-Usp.

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Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of ∼ 10−5 – 10−6 for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of ∼ 10−8 – 10−9 .

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X-ray backscattering (diffraction at a Bragg angle of π/2): A review

Cited by 2 publications

References 126 publications

Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

Precise determination of crystal lattice parameters

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