1994
DOI: 10.1149/1.2054714
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X‐Ray Absorption Study of Electrochemically Grown Oxide Films on AlCr Sputtered Alloys: II . In Situ Studies

Abstract: The chemistry of chromium in the passive film on sputter-deposited chromium and AlCr thin films has been investigated in situ in an electrochemical cell under potential control by studying x-ray absorption near edge structure. At high potentials, Cr in the AlCr alloys was oxidized to the 6-valent state. Depending on the rate of potential increase, 6-valent chromium either dissolved from the alloy or was trapped in the passive film where it was electroactive, i.e., the valence state could be reversibly switched… Show more

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Cited by 21 publications
(9 citation statements)
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(19 reference statements)
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“…[53][54][55] The valence state of atoms and their coordination numbers have been studied by using X-ray absorption near-edge structure and extended X-ray absorption fine structure analysis, but these were often limited to pure metals and binary alloys. [56][57][58][59][60][61][62][63][64][65][66][67][68][69] Synchrotron XRD measurements have been performed at grazing incidence (GIXRD) to analyze thin-surface layers with high resolution and sensitivity, showing advantages for rapid and detailed structural characterization. [70][71][72][73][74][75] Moreover, X-ray reflectivity (XRR) measurements have also been employed to study electrochemical oxide growth on pure metal and alloys.…”
Section: Introductionmentioning
confidence: 99%
“…[53][54][55] The valence state of atoms and their coordination numbers have been studied by using X-ray absorption near-edge structure and extended X-ray absorption fine structure analysis, but these were often limited to pure metals and binary alloys. [56][57][58][59][60][61][62][63][64][65][66][67][68][69] Synchrotron XRD measurements have been performed at grazing incidence (GIXRD) to analyze thin-surface layers with high resolution and sensitivity, showing advantages for rapid and detailed structural characterization. [70][71][72][73][74][75] Moreover, X-ray reflectivity (XRR) measurements have also been employed to study electrochemical oxide growth on pure metal and alloys.…”
Section: Introductionmentioning
confidence: 99%
“…3 X-ray adsorption offers a powerful method for the in situ study of the kinetics of chemical changes taking place at surfaces, by monitoring the growth and dissolution of the films. [3][4][5][6][7][8][9][10][11][12] X-ray adsorption near-edge structure ͑XANES͒ has been used to study the products of reactions of chromate conversion coatings ͑CCC͒ adhering to Al surfaces, and the behavior of these products with time and exposure to solutions. [4][5][6][7][8][9][10][11][12][13] CCCs are made up of Cr͑III͒ and Cr͑VI͒ species such as in CrO 4…”
mentioning
confidence: 99%
“…[3][4][5][6][7][8][9][10][11][12] X-ray adsorption near-edge structure ͑XANES͒ has been used to study the products of reactions of chromate conversion coatings ͑CCC͒ adhering to Al surfaces, and the behavior of these products with time and exposure to solutions. [4][5][6][7][8][9][10][11][12][13] CCCs are made up of Cr͑III͒ and Cr͑VI͒ species such as in CrO 4…”
mentioning
confidence: 99%
“…The depth distribution and valence of ion species in artificial crevices have been investigated by Isaacs et al using X-ray fluorescence techniques. [9][10][11] For instance, an in situ study of anodic dissolution of stainless steel in chloride solution found that the salt layer formed on nickel/chromium steels was rich in iron and contained little nickel and a very small amount of chromium. 9 In an attempt to understand the dissolution kinetics for pits and crevices in aluminum and to determine if dichromate inhibits localized corrosion by reducing the dissolution kinetics, the electrochemical behavior of aluminum artificial crevice electrodes in chloridecontaining solutions with and without dichromate ions was investigated in the present work.…”
mentioning
confidence: 99%