1995
DOI: 10.1021/la00006a033
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X-ray Absorption Spectroscopic Studies of Cadmium and Selenite Adsorption on Aluminum Oxides

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Cited by 66 publications
(67 citation statements)
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“…As will be remembered, UE18R 2228 was the densely welded tuff sample that had by far the lowest porosity and specific surface area three to five times lower compared to the rest of the samples. It has been shown before (Papelis, 1995), that the structure and porosity of the solid does affect the apparent surface coverage determined by XPS. This fact may be due to the orientation of the sample and counting resulting from several layers in a porous sample compared to a nonporous one.…”
Section: Countsmentioning
confidence: 93%
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“…As will be remembered, UE18R 2228 was the densely welded tuff sample that had by far the lowest porosity and specific surface area three to five times lower compared to the rest of the samples. It has been shown before (Papelis, 1995), that the structure and porosity of the solid does affect the apparent surface coverage determined by XPS. This fact may be due to the orientation of the sample and counting resulting from several layers in a porous sample compared to a nonporous one.…”
Section: Countsmentioning
confidence: 93%
“…The adsorbed layer thickness was estimated by comparing the photoelectric peak of the metal of interest to the photoelectric peak of the most abundant cation on the surface, Si. Specifically, the adsorbed layer thickness was calculated based on Equation (13), a generalization of the equation used by Papelis (1995) to calculate surface coverages of adsorbents.…”
Section: Countsmentioning
confidence: 99%
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