1994
DOI: 10.1103/physrevb.49.12347
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X-ray-absorption fine structure in embedded atoms

Abstract: Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine structure (XAFS). This atomic-XAFS or AXAFS arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and measurements confirm the existence of AXAFS and show that it can dominate contributions such as multi-electron excitations. The structure is sensitive to chemical effects and thus provides a new probe of bonding and exchange effects on the scattering potential.

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Cited by 180 publications
(173 citation statements)
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“…It was first shown by Holland et al [28] that µ 0 (k) = µ free (k)(1 + χ AX (k)), with µ free being the free atomic background and χ AX (k) being a fine structure attributed to AXAFS. As was pointed out by Rehr et al [29], the AXAFS contribution will be visible as a peak in the Fourier transform at an unphysically short distance, often less than 1.5 Å. Ramaker et al [21] have recently discussed the origin and the parameters determining the AXAFS. The AXAFS is caused by the scattering of the photoelectron off the deep valence electrons in the periphery of the absorbing atom.…”
Section: Axafsmentioning
confidence: 98%
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“…It was first shown by Holland et al [28] that µ 0 (k) = µ free (k)(1 + χ AX (k)), with µ free being the free atomic background and χ AX (k) being a fine structure attributed to AXAFS. As was pointed out by Rehr et al [29], the AXAFS contribution will be visible as a peak in the Fourier transform at an unphysically short distance, often less than 1.5 Å. Ramaker et al [21] have recently discussed the origin and the parameters determining the AXAFS. The AXAFS is caused by the scattering of the photoelectron off the deep valence electrons in the periphery of the absorbing atom.…”
Section: Axafsmentioning
confidence: 98%
“…In the last few years, several research groups [28,29] have reported on the oscillatory structure detected in the atomic background µ 0 that is removed from the raw absorption data. It was first shown by Holland et al [28] that µ 0 (k) = µ free (k)(1 + χ AX (k)), with µ free being the free atomic background and χ AX (k) being a fine structure attributed to AXAFS.…”
Section: Axafsmentioning
confidence: 99%
“…The pseudo-radial distribution function FT(v(k)*k 3 ) was calculated by Fourier transforming the k 3 -weighted experimental v(k) function, multiplied by a Bessel window, into reciprocal space. EXAFS data analysis was performed using theoretical backscattering phases and amplitudes calculated with the ab-initio multiple-scattering code FEFF7 [38]. Single scattering and multiple scattering paths in the a-MoO 3 model structure were calculated up to 5.0 Å with a lower limit of 2.0% in amplitude with respect to the strongest backscattering path.…”
Section: Sample Characterizationmentioning
confidence: 99%
“…[8,15] The results mentioned above for bulk metal systems, organometallic systems, and supported metal catalysts have shown that AXAFS is a viable tool for probing the influence of the local surroundings on the electronic properties of a central atom. Although the presence of an AXAFS contribution in the X-ray absorption data of oxide systems has been established, [20,27] to the best of our knowledge, no systematic study of the influence of the chemical surroundings, including the effect of the support, on the AXAFS of small metal oxide clusters has yet been carried out.In the present work, three case studies have been used to determine the influence of changes in the first and next nearest neighbour shells on the AXAFS of vanadium bulk reference compounds and alumina-supported vanadium oxide clusters. In particular, the effects of oxidation/reduction treatments and vanadium oxide loading on the Fourier transform AXAFS peak (both intensity and centroid position) of alumina-supported vanadium oxide clusters have been determined.…”
mentioning
confidence: 99%