Mechatronics 2013 2014
DOI: 10.1007/978-3-319-02294-9_58
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“…The result agrees with those of an analytical model [10] assuming σ rest = 6 mrad, where σ rest is the contribution to the error in determination of the Cherenkov angle from sources other than the emission point uncertainty and due to the position resolution of the detector (see Ref. [10] for more detail). This contribution from other sources may be partially explained by non-uniformity along the thickness direction.…”
Section: Influence Of Refractive Index Uniformity On Rich Detectorssupporting
confidence: 85%
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“…The result agrees with those of an analytical model [10] assuming σ rest = 6 mrad, where σ rest is the contribution to the error in determination of the Cherenkov angle from sources other than the emission point uncertainty and due to the position resolution of the detector (see Ref. [10] for more detail). This contribution from other sources may be partially explained by non-uniformity along the thickness direction.…”
Section: Influence Of Refractive Index Uniformity On Rich Detectorssupporting
confidence: 85%
“…This acceptable variation is based on the model calculation in Ref. [10], where the degradation of the Cherenkov angle resolution in the dual layer radiator scheme is very small. This was empirically verified in a dedicated beam test [11].…”
Section: Influence Of Refractive Index Uniformity On Rich Detectorsmentioning
confidence: 99%