Abstract:Test power has become a serious problem with scanbased testing. It can lead to prohibitive test power in the process of test application. During the process of scan shifting, the states of the flip-flops are changing continually, which causes excessive switching activities. Test vector reordering for reducing scan in scan out power is one of the general goal of low power testing. In this paper Dijakstra algorithm is proposed to reorder the test vectors in an optimal manner to minimize switching activity during… Show more
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