WSP-a processor for real-time wheel slip measurement in vehicles

Hierarchical Test Program Development for Scan Testable Circuits

“…161, of which the circuit characteristics are given in table 1. an experiment, we developed the test program for the wheel-slip processor hierarchically and compared the achieved results, with what would be obtained by developing the test program based on the flatten gate level model for the complete chip. Thereby the test generator has been invoked for each modelled fault.…”