Abstract:Crossbar resistive memory with the 1 Selector 1 Resistor (1S1R) structure is attractive for nonvolatile, high-density, and low-latency storage-class memory applications. As technology scales down to the single-nm regime, the increasing resistivity of wordline/bitline becomes a limiting factor to device reliability. This paper presents write/read communication channels while considering the line resistance and device variabilities by statistically relating the degraded write/read margins and the channel paramet… Show more
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