Working accuracy evaluation of the small electronic products at micro residual stress analysis

Suzuki, Hideto; Amano, Sadao; Kasuya, Takeshi; Kiyota, Naka; Ootuki, Tomoya; Takei, Masanori

doi:10.1299/jsmeibaraki.2003.57

The Proceedings of Ibaraki District Conference

2003

DOI: 10.1299/jsmeibaraki.2003.57

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Working accuracy evaluation of the small electronic products at micro residual stress analysis

Hideto Suzuki

Sadao Amano

Takeshi Kasuya

et al.

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Working accuracy evaluation of the small electronic products at micro residual stress analysis

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