Wireless pad-free integrated circuit debugging by powering modulation and lock-in infrared sensing

Abstract

In this work, non-functional radio frequency identification pad-free chips are analyzed by modulating its powering scheme and noninvasively sensing their surface infrared (IR) emission with an IR camera following lock-in strategies. This approach is justified by the chip wireless powering strategy and its pad-free design. As a result, latch-up triggering has been identified as the failure mechanism, also showing that electrical figures of merit can be extracted non-invasively (i.e., coils coupling frequency and its bandwidth).

Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging

“…In this framework, the present work extends the use of IR-LIT to functional and consumption analysis of RFID IC's with IPT systems. To show this, the new generation of RFID IC's resulting from the study carried out in [27] has been used. In such new IC's, new dysfunctions raised, that could not be studied only testing them with the modulation approach presented in [27].…”

“…Moreover, it also allows the detection of weak heat sources below 1 mºC, which is the common case in microelectronics [25]. In [27], such an approach was used for debugging an RFID IC with an IPT system, where a latch-up J. León I in the IC powering scheme was detected.…”

Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits

“…13,17,18,19 Currently, such techniques are only employed for failure analysis and debugging, 13,17,18,20,21,22,23,24 whereas maximum frequencies of 30 MHz in test structures 19 and around 14 MHz in IC powering systems 17 have been reported. They only monitor the thermal amplitude of hot spots, where thermal phase lag only assists to locate them through the following criterion: a maximum in amplitude and a minimum in phase lag should be detected at the same place.…”

“…They only monitor the thermal amplitude of hot spots, where thermal phase lag only assists to locate them through the following criterion: a maximum in amplitude and a minimum in phase lag should be detected at the same place. 17,19 As a new application scenario, this work proposes tracking the current paths in more complex systems (RF ICs) operating within GHz range by thermal phase lag measurements. In comparison with amplitude monitoring, phase lag is surface emissivity independent 9 and more sensitive to heat sources detection (thermal activity) when synchronized with a driving electrical signal.…”

“…12,13,14,15,16,17 They noninvasively sense the heat generated while the IC is under operation. Besides, the Joule effect allows converting electrical information from a high frequency f into a thermal field at a lower frequency…”