Wireless Embedded Control System for Atomically Precise Manufacturing

Khan, Yasser; Randall, John N.

doi:10.1109/itng.2011.165

Cited by 1 publication

(1 citation statement)

References 4 publications

(3 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…41 Extremely sharp tips with low aspect ratio are vital for scanning tunnelling microscopy, and eventually atomically precise manufacturing. 45 We tried to address these issues by using well-established procedures from literature, and facilitating that with "dynamic etching" and computer control. Synergy of "drop-off" method, "dynamic electrochemical etching," and reverse biasing after "drop-off" produced highly reproducible tips with controllable cone angles.…”

Section: Discussionmentioning

confidence: 99%

Two-step controllable electrochemical etching of tungsten scanning probe microscopy tips

Khan

Al-Falih

Zhang

et al. 2012

Review of Scientific Instruments

Self Cite

View full text Add to dashboard Cite

Dynamic electrochemical etching technique is optimized to produce tungsten tips with controllable shape and radius of curvature of less than 10 nm. Nascent features such as "dynamic electrochemical etching" and reverse biasing after "drop-off" are utilized, and "two-step dynamic electrochemical etching" is introduced to produce extremely sharp tips with controllable aspect ratio. Electronic current shut-off time for conventional dc "drop-off" technique is reduced to ∼36 ns using high speed analog electronics. Undesirable variability in tip shape, which is innate to static dc electrochemical etching, is mitigated with novel "dynamic electrochemical etching." Overall, we present a facile and robust approach, whereby using a novel etchant level adjustment mechanism, 30° variability in cone angle and 1.5 mm controllability in cone length were achieved, while routinely producing ultra-sharp probes.

show abstract

Section: Discussionmentioning

confidence: 99%