2017
DOI: 10.1109/tim.2016.2619958
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Wideband Nondestructive Measurement of Complex Permittivity and Permeability Using Coupled Coaxial Probes

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Cited by 30 publications
(12 citation statements)
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“…The simulation results obtained for the negative index balanced structure can be verified with the help of scattering parameter measurement using a vector network analyser (VNA). Most of the scattering measurement techniques required a sample holder [42,43] and the special requirement of the sample holder can be avoided with the use of rectangular waveguide measurement. The dimensions of the waveguide will depend on the frequency range, in which parameters are to be retrieved for unknown materials.…”
Section: Microstrip Implementation and Results Analysismentioning
confidence: 99%
“…The simulation results obtained for the negative index balanced structure can be verified with the help of scattering parameter measurement using a vector network analyser (VNA). Most of the scattering measurement techniques required a sample holder [42,43] and the special requirement of the sample holder can be avoided with the use of rectangular waveguide measurement. The dimensions of the waveguide will depend on the frequency range, in which parameters are to be retrieved for unknown materials.…”
Section: Microstrip Implementation and Results Analysismentioning
confidence: 99%
“…There are three kinds of conventional methods to measure the complex permeability which mainly focus on high frequency. The first is the ''transmission method'' [13]- [17], by means of the variation of the reflected and transmitted field. The measurement sensitivity drops rapidly with the decrease of the frequency due to the decreased transmission and reflection field energy at a lower frequency.…”
Section: Introductionmentioning
confidence: 99%
“…The analysis methods are very closely related to the coaxial probe discussed in the previous subsection. Nevertheless, different formulations have been the subject of research in very recent years [15][16][17].…”
Section: Proposed Models For the Characterization Of The Two-portmentioning
confidence: 99%
“…In fact, this kind of problem has received very recent attention for different types of materials and with different types of probes for the input/output [15][16][17]. In this paper, two different models based on mode-matching along the longitudinal direction are proposed for characterizing the two-port problem associated with the coaxial probe for dielectric measurement of homogeneous samples.…”
Section: Introductionmentioning
confidence: 99%