Wideband measurement of the dielectric constant of an FR4 substrate using a parallel-coupled microstrip resonator

Holzman, E.L.

doi:10.1109/tmtt.2006.877061

Cited by 46 publications

(24 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…At the operation frequencies, the dielectric permittivity of this material is e d ¼ 4:2ð1 þ 0:025iÞ. 17 Let us point out that the small imaginary part of this permittivity indicates that FR4 has a poor performance as an absorber of microwaves frequencies. Particularly, we have designed a metasurface made of aluminum which can enhance the absorption of a)…”

Section: Experimental Verification Of Total Absorption By a Low-loss mentioning

confidence: 99%

Experimental verification of total absorption by a low-loss thin dielectric layer

Díaz-Rubio

Hibbins

Carbonell

et al. 2015

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

Section: Experimental Verification Of Total Absorption By a Low-loss mentioning

confidence: 99%

Experimental verification of total absorption by a low-loss thin dielectric layer

Díaz-Rubio

Hibbins

Carbonell

et al. 2015

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

“…There are various approaches to measure the dielectric constant of a material for different sample conditions and frequency ranges [1][2][3][4][5]. The resonant cavity method is widely used for accurate measurements, but only for permittivities near resonant frequencies, which are usually very high (>1GHz) [1][2][3].…”

Section: Introductionmentioning

confidence: 99%

Radial waveguide model for permittivity measurements of disk-shaped dielectric samples at RF frequencies

Long

Rushton

Sievenpiper

2013

2013 IEEE Antennas and Propagation Society International Symposium (APSURSI)

View full text Add to dashboard Cite

A new approach for measuring dielectric constants at RF frequencies (30-300MHz) is proposed. The proposed method utilizes the parallel plate test fixture and retrieves permittivity based on a radial waveguide mode. It is verified by simulation, and moderate accuracy (<10%) is obtained. This method can be a complementary approach to other conventional ones which are available for lower or higher frequencies.

show abstract

“…Numerous techniques are known for characterization of dielectric properties over different frequency bands [4][5][6][7][8][9][10][11][12][13]. Each technique benefits a different type of materials over a certain frequency range.…”

Section: Introductionmentioning

confidence: 99%

“…The resonance techniques widely used in the past several decades to characterize dielectric materials are accurate, but are narrowband [4][5][6]. Reference [7] extends the resonance techniques to a wideband application by designing a complex structure on a PCB to cover multi-resonant frequency points. The dielectric properties at the corresponding frequency points are tuned by matching the numeric resonant peak to the measurements.…”

Section: Introductionmentioning

confidence: 99%

Planar Transmission Line Method for Characterization of Printed Circuit Board Dielectrics

Zhang¹,

Koledintseva²,

Antonini³

et al. 2010

PIER

View full text Add to dashboard Cite

Abstract-An effective approach to characterize frequency-dispersive sheet materials over a wide RF and microwave frequency range based on planar transmission line geometries and a genetic algorithm is proposed. S-parameters of a planar transmission line structure with a sheet material under test as a substrate of this line are measured using a vector network analyzer (VNA). The measured S-parameters are then converted to ABCD matrix parameters. With the assumption of TEM/quasi-TEM wave propagation on the measured line, as well as reciprocity and symmetry of the network, the complex propagation constant can be found, and the corresponding phase constant and attenuation constant can be retrieved. Attenuation constant includes both dielectric loss and conductor loss terms. At the same time, phase term, dielectric loss and conductor loss can be calculated for a known transmission line geometry using corresponding closedform analytical or empirical formulas. These formulas are used to construct the objective functions for approximating phase constants, conductor loss and dielectric loss in an optimization procedure based on a genetic algorithm (GA). The frequency-dependent dielectric properties of the substrate material under test are represented as one or a few terms following the Debye dispersion law.The parameters of the Debye dispersion law are extracted using the GA by minimizing the discrepancies between the measured and the corresponding approximated loss and phase terms. The extracted data is verified by substituting these data in full-wave numerical modeling of structures containing these materials and comparing the simulated results with experimental.

show abstract

Wideband measurement of the dielectric constant of an FR4 substrate using a parallel-coupled microstrip resonator

Cited by 46 publications

References 11 publications

Experimental verification of total absorption by a low-loss thin dielectric layer

Experimental verification of total absorption by a low-loss thin dielectric layer

Radial waveguide model for permittivity measurements of disk-shaped dielectric samples at RF frequencies

Planar Transmission Line Method for Characterization of Printed Circuit Board Dielectrics

Contact Info

Product

Resources

About