In
this work, a monolayer of n-alkanethiol formed
on an approximately 8 nm thick Au film, deposited onto a Si substrate
with a thermally grown SiO2 layer, was characterized using
reflected light microscope with a narrow band-pass filter. The semitransparent,
thin Au film, which is electrically conductive, provides interference
in the films, and the optical properties of the monolayer depend on
the alkanethiol length. When the surface of a Au film is photographed
with a digital camera attached to the microscope, the color changes
slightly with formation of a monolayer. The difference depends on
the wavelength of a light source. Observations with narrow band-pass
filters of 490 and 520 nm were found to provide a large difference,
which is useful to characterize a monolayer. The difference increases
with the length of the alkyl chains in the monolayer. Thus, the presented
approach enables the fact that the number of the alkyl-chain units
is identified through observations at an appropriate wavelength. This
simple technique, which uses a general commercial microscope, can
thus be used to confirm the presence of a monolayer with a molecular-order
thickness.