2019
DOI: 10.1021/acs.nanolett.9b00178
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Wide-Field Spectral Super-Resolution Mapping of Optically Active Defects in Hexagonal Boron Nitride

Abstract: Point defects can have significant impacts on the mechanical, electronic and optical properties of materials. The development of robust, multidimensional, high-throughput and large-scale characterization techniques of defects is thus crucial, from the establishment of integrated nanophotonic technologies to material growth optimization. Here, we demonstrate the potential of wide-field spectral single-molecule localization microscopy (spectral SMLM) for the determination of ensemble spectral properties, as well… Show more

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Cited by 77 publications
(112 citation statements)
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References 51 publications
(113 reference statements)
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“…Conversely, while the potential of varying charge states of the same structural defect may be more suitable to explain the results based on demonstrations of spectral jumping of up to 100 nm, this has been previously attributed to photochemical reactions taking place at the flake surface and/or trapped carrier induced stark shifts, neither of which appear suitable to explain the consistency of the localization observed in our study across multiple growths and samples. Furthermore, these conclusions are supported by recent photophysical characterization of SPEs within these specific spectral regions …”
Section: Comparison Of Emission Energy and Density Of Cvd Hbn Spes Insupporting
confidence: 67%
“…Conversely, while the potential of varying charge states of the same structural defect may be more suitable to explain the results based on demonstrations of spectral jumping of up to 100 nm, this has been previously attributed to photochemical reactions taking place at the flake surface and/or trapped carrier induced stark shifts, neither of which appear suitable to explain the consistency of the localization observed in our study across multiple growths and samples. Furthermore, these conclusions are supported by recent photophysical characterization of SPEs within these specific spectral regions …”
Section: Comparison Of Emission Energy and Density Of Cvd Hbn Spes Insupporting
confidence: 67%
“…Raman shift (cm Applications of CVD multilayer h-BN. The multilayer h-BN transferred onto a SiO 2 (300 nm)/Si substrate was investigated by room-temperature Raman and photoluminescence (PL) spectroscopies for determining the optically active defect distribution [35][36][37][38][39][40][41] . As shown in supplementary Fig.…”
Section: Mechanism Of Vlsg Of Multilayer H-bn On Fe 82 B 18 Alloymentioning
confidence: 99%
“…14d-f). The fact that no optical emissions at energies between 1.7 and 2.2 eV could be found in large uniform areas provides the possibility to artificially fabricate optically active defects for optoelectronics in the future 40 .…”
Section: Mechanism Of Vlsg Of Multilayer H-bn On Fe 82 B 18 Alloymentioning
confidence: 99%
“…By extending our model to include polarized emitter families and comparing to polarization resolved data, we could leverage the statistical power of much larger emitter ensembles to study the distribution of dipole orientations. A similar extension of our model could account for the emitters' spectra; including spectrally resolved data could reveal phenomena such as zero phonon line clustering, which has been observed in multiple recent studies [40][41][42]. By adapting the underlying spatial probability distribution functions, the model can be further extended to account for emitters clustering near edges or other extended defects.…”
Section: Discussionmentioning
confidence: 75%