2008
DOI: 10.2478/s11534-008-0104-3
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Wide bandpass optical filters with TiO2 and Ta2O5

Abstract: Abstract:Complex multilayer thin film filters for optical applications have been designed, prepared and characterized in this work. E-beam reactive evaporation technique has been used as a deposition process. In the first stage, optimized individual film layers of TiO 2 , Ta 2 O 5 , and SiO 2 are deposited and characterized optically and structurally before the deposition of multilayered structures. The filter designs are based upon 33 layered SiO 2 /TiO 2 and SiO 2 /Ta 2 O 5 configurations on glass substrate.… Show more

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Cited by 14 publications
(14 citation statements)
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“…High refractive index of about 2.42 (l = 550 nm) in case of TiO 2 was found due to high energy deposi− tion process of microwave assisted magnetron sputtering. Similar value has been also obtained by others [2].…”
Section: Antireflective Multilayer Design Detailssupporting
confidence: 79%
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“…High refractive index of about 2.42 (l = 550 nm) in case of TiO 2 was found due to high energy deposi− tion process of microwave assisted magnetron sputtering. Similar value has been also obtained by others [2].…”
Section: Antireflective Multilayer Design Detailssupporting
confidence: 79%
“…Based on recorded spec− tra, refractive index and extinction coefficient of single la− yers were estimated. Fitting of experimental results for TiO 2 and SiO 2 thin films were made using Drude -Lorentz dis− persion model and Powell's analysis method. Calculations were performed by using Pearson's test -c 2 (Chi−square).…”
Section: Methodsmentioning
confidence: 99%
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“…The dimensions of such devices are in nano-meters and parts of them reached the size of few atoms [17]. The target of optimization techniques is to suggest the numerical values of the parameters that lead to the best and optimum performance of the device or circuit.…”
mentioning
confidence: 99%