Whole visible range imaging ellipsometry

Abstract

The ellipsometric image contrast for patterned film in whole visible range is simulated and analyzed in this article. By the Fresnel equation and the Jones Matrix, the characteristic wavelength selection method to enhance the image contrast is built. The ellipsometric reflected intensity of specific thin film is nulled into dark by rotating the phase angle of compensator and the azimuth angle of polarizer in whole visible range, which results in higher contrast between non-null and null images after the proper wavelength selection. The approach enables the image defect recognition of patterned film more obvious than recent single wavelength imaging ellipsometry and white light reflective image.