2010 International Conference on Digital Manufacturing &Amp; Automation 2010
DOI: 10.1109/icdma.2010.175
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Wheat Image Correction for Feature Segmentation Based on Color Linear CCD

Abstract: This paper presented a machine vision system with a color linear CCD to identify several China wheat classes. However, these images were deformed due to color linear CCD itself, image noise and uneven brightness also existed. The image needs to be corrected so as to segment the wheat features better. Algorithms of linearity equation were developed to correct geometric distortions; homomorphic filtering and space domain enhancement methods for image restoration also played a significant role. From the evaluatio… Show more

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Cited by 1 publication
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“…The inspection and the classification of good quality wheat grains can be done by manually through a series of instrumental or chemical analysis. Obtaining good quality wheat product through these tests and analysis is subjective, time consuming, less efficient, costly and the safe inspection of food without damaging its structure is nearly impossible [2,3]. In recent years, it has become imperative to use automatic systems in the inspection and classification of wheat seeds to eliminate all those adverse conditions mentioned.…”
Section: Introductionmentioning
confidence: 99%
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“…The inspection and the classification of good quality wheat grains can be done by manually through a series of instrumental or chemical analysis. Obtaining good quality wheat product through these tests and analysis is subjective, time consuming, less efficient, costly and the safe inspection of food without damaging its structure is nearly impossible [2,3]. In recent years, it has become imperative to use automatic systems in the inspection and classification of wheat seeds to eliminate all those adverse conditions mentioned.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, it has become imperative to use automatic systems in the inspection and classification of wheat seeds to eliminate all those adverse conditions mentioned. With rapidly developing computer technologies, machine vision systems and image processing techniques have become one of the most popular research areas in wheat inspection and classification, because they have the ability to visually characterize wheat grains by their physical attributes and the process is objective, speedy, most efficient, cheap, repeatable and harmless to wheat seeds [2,3]. Through the last years, many researchers have evaluated machine vision and image processing techniques if they really meet the expectations for the inspection and classification of the quality of wheat.…”
Section: Introductionmentioning
confidence: 99%