Wear and friction of Y-TZP spheres reciprocating against various sialon plates

Abstract

The friction and wear characteristics of various Y-TZP-sialon sliding systems were examined. These systems consisted of a Y-TZP sphere reciprocating against various sialon plates. The sialons differed in phase content and composition. They range from cz-sialons to 13-sialons and include 0~-13 composites. The length of the wear tracks was 10 mm, the loads used were 2 and 8 N, the frequencies 1,4 and 8 Hz and the humidity was controlled by flushing with dry nitrogen. The tests were continued for 8, 24 and 72 h at room temperature. The total vertical displacement and the friction coefficient were measured continuously and sampled. Various additional measurements were performed after each test and the worn surfaces were observed microscopically. It was concluded that the :z-J3 composites show less wear than the 0~-and 13-sialons. It was also concluded that the amount of wear increases approximately linearly with load and increases significantly more than linearly with frequency. A wear mechanism was derived incorporating the measured data and the observations.

Y-TZP sliding reciprocatively against various AION ceramics

“…A comparison with earlier studies on Y-TZP-sialon systems under approximately the same conditions [9] shows that a number of features are found in both systems. The amount of wear at a frequency of 1 Hz is about equal, the banding is found in both systems and a transition to severe wear was also observed in the Y-TZP-sialon system.…”

“…The pin frequencies, f, of 1 and 4 Hz correspond to maximum velocities of 0.02 and 0.08 m s-1, respectively. Normal loads, P, of 2 and 8 N *Also affiliated to the Centre for Technical Ceramics, Eindhoven University of Technology [9]. The total vertical displacement of the pin during sliding was measured by an extensometer (Sangamo DG1).…”

“…The displacement and friction force were simultaneously sampled under external triggering control with a computerized data acquisition system. Further details about the data acquisition are given elsewhere [9].…”