Waveplate analyzer using binary magneto-optic rotators

Chen, Xiaojun; Yan, Lianshan; Yao, Xuan

doi:10.1364/oe.15.012989

Cited by 15 publications

(4 citation statements)

References 13 publications

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“…Rotation extinction methods measure the phase retardations by detecting the variation of outgoing light intensity through rotating polarization elements [5,6]. Modulator modulation methods usually measure the phase retardations by using electro-optical or magneto-optical modulators to change the polarization state of the light beam and then judging the extinction angle positions [7,8]. Interferometries get the phase retardation of the measured wave plate (MWP) by analyzing the intensities of interference signals under different polarization directions [9].…”

Section: Introductionmentioning

confidence: 99%

Simultaneous measurement of phase retardation and fast axis azimuth of wave plate based on equivalent component and phase detection

Chen¹,

Ding²,

Yu³

et al. 2022

Meas. Sci. Technol.

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Wave plates (WPs) are key components in optical polarization systems whose phase retardations and fast axis azimuths should be determined accurately. At present many measurement methods are based on light intensity detection which is inevitably affected by light intensity fluctuations so that the measurement accuracy is limited. What’s more, quite a few methods cannot measure WPs’ fast axis azimuths simultaneously. In this paper a method of simultaneously measuring the phase retardation and fast axis azimuth of arbitrary WP is proposed, which is based on equivalent component and phase detection. A rotatable half wave plate (HWP) and a retroreflector are used and its effect is equivalent to measuring an equivalent WP whose phase retardation is twice that of the measured wave plate, which is equivalent to doubling the measurement resolution. Phase detection is used to process the signals which means the measurement accuracy is better than that by usual light intensity detection. What’s more, the presented method eliminates the angle positioning errors of birefringent components in principle which exists in many present WP measurement methods. Finally, the measurement system setup is simple as well as the measurement process. The measurement formulae are deduced and corresponding WP measuring system is established. The error analysis shows that the system measurement uncertainty is about 3.9′ for the phase retardation and 5” for the fast axis azimuth. Experiment results and comparisons of quarter WPs and HWPs show that the presented method is in good agreement with other method. The phase retardation measurement repeatability is also good with a standard deviation about 2′.

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Section: Introductionmentioning

confidence: 99%

Simultaneous measurement of phase retardation and fast axis azimuth of wave plate based on equivalent component and phase detection

Chen¹,

Ding²,

Yu³

et al. 2022

Meas. Sci. Technol.

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“…Zhang and his team developed a series of laserbased techniques including the laser frequency-splitting method, the laser feedback method, and the polarization flipping method, and they applied these systems to characterize waveplates with very high precision and accuracy [17,[24][25][26]. The polarimetry is another commonly used technique, and different types of polarimeters have been developed to characterize the polarization properties of waveplates [12,[27][28][29][30][31][32]. Chenault and Chipman applied a rotating sample spectropolarimeter to measure the linear retardance and linear diattenuation of a quasi-achromatic waveplate [12].…”

Section: Introductionmentioning

confidence: 99%

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Chen

Shi

et al. 2018

Opt. Express

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Composite waveplates (CWs) consisting of multiple single waveplates are basic polarization elements and widely used to manipulate the polarized light in optical systems, and their performances affect the final accuracy and precision significantly. This research proposes a method for the comprehensive characterization of an arbitrary CW based on spectroscopic Mueller matrix polarimetry. An analytical model is established to describe a general CW by extending Jones' equivalent theorem with Mueller matrix calculus. In this model, an arbitrary CW is optically equivalent to a cascaded system consisting of a linear retarder with slight diattenuation followed by an optical rotator, and its polarization properties are completely described by four polarization parameters, including the retardance, the fast axis azimuth, the rotation angle, and the diattenuation angle. Analytical relations between the polarization properties, the structure, and the Mueller matrix of the CW are then derived from the established model. By the proposed method, the polarization parameters of an arbitrary CW can be comprehensively characterized over an ultra-wide spectral range via only one measurement. Moreover, the actual structure of the CW, including the thicknesses and fast axis azimuths of the single waveplates, as well as the axis alignment errors, can be completely reconstructed from the polarization spectra. Experiments performed with a house-developed broadband Mueller matrix polarimeter on three typical CWs including a compound zero-order waveplate, an achromatic waveplate and a specially designed biplate have demonstrated the capability of the proposed method.OCIS codes: (120.0120) Instrumentation, measurement, and metrology; (120.2130) Ellipsometry and polarimetry; (230.5440) Polarization-selective devices; (260.5430) Polarization; (120.6200) Spectrometers and spectroscopic instrumentation. with a waveplate in the external cavity," Opt. Lett. 40(15), 3615-3618 (2015). 8. J. L. Vilas and A. Lazarova-Lazarova, "A simple analytical method to obtain achromatic waveplate retarders," J.

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“…To accurately determine the phase retardation of a WP is of great importance to its manufacturing process and application effect [1,2]. Nowadays, various measurement methods for the retardation of WPs have been developed [3][4][5][6][7][8][9][10][11][12][13]. Most of them are based on the traditional principles; for instance, the rotating extinction or the optical interferometry.…”

Section: Introductionmentioning

confidence: 99%

Measurement method for optical retardation based on the phase difference effect of laser feedback fringes

et al. 2015

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We present a measurement method for optical phase retardation, which utilizes a phase-difference phenomenon of the feedback fringes in orthogonally polarized directions of a laser with anisotropic weak feedback. This phase difference is dominated by the measured retardation. The measurement principles are given based on the 3-mirror cavity model, and experiments are conducted with quartz waveplates (WPs). A measurement range 0°-180° is achieved, the uncertainty is theoretically better than 0.5°, and the measurement precision can be improved further. This method does not require researchers to know beforehand the principal axes directions of the WPs, and has better anti-disturbance ability than the previous method based on laser feedback.

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Waveplate analyzer using binary magneto-optic rotators

Abstract: We demonstrate a simple waveplate analyzer to characterize linear retarders using magneto-optic (MO) polarization rotators. The all-solid state device can provide highly accurate measurements for both the retardation of the waveplate and the orientation of optical axes simultaneously.

Cited by 15 publications

References 13 publications

Simultaneous measurement of phase retardation and fast axis azimuth of wave plate based on equivalent component and phase detection

Simultaneous measurement of phase retardation and fast axis azimuth of wave plate based on equivalent component and phase detection

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Measurement method for optical retardation based on the phase difference effect of laser feedback fringes

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