2020
DOI: 10.1109/tim.2019.2962564
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Wavelength Shift Measurement With Resonance Characteristic Prediction Algorithm Using Intensities at Discrete Wavelengths

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Cited by 3 publications
(1 citation statement)
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“…The large FSR derived from the envelope of the short silicon cavity provides a larger dynamic range, while the long silicon cavity's dense stripes provide a high resolution. Additionally, in order to lower the cost of the measurement system, a peak tracking technique based on discrete wavelengths is proposed 31 . The resonance characteristics are analyzed based on the intensities at discrete wavelength points.…”
Section: Fast Interrogation Techniquesmentioning
confidence: 99%
“…The large FSR derived from the envelope of the short silicon cavity provides a larger dynamic range, while the long silicon cavity's dense stripes provide a high resolution. Additionally, in order to lower the cost of the measurement system, a peak tracking technique based on discrete wavelengths is proposed 31 . The resonance characteristics are analyzed based on the intensities at discrete wavelength points.…”
Section: Fast Interrogation Techniquesmentioning
confidence: 99%