Abstract:We report a scheme for polarization sensitive near field imaging of nanostructured samples by making use of broadband polarized near field illumination and detection of polarization states of scattered light by a spectrally encoded analyzer. The analyzer comprising a combination of polarizer, a multi-order waveplate and a broadband quarter waveplate allows analysis of the spectrally encoded polarization states of scattered light for characterization of the polarization properties of nano structures from a sing… Show more
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