Wavelength‐Dispersive X‐Ray Fluorescence Analysis: Part III

Abstract

Wavelength‐dispersive X‐ray fluorescence (WD‐XRF) is a somewhat conservative technique, staying in one raw with the traditional X‐ray diffraction method. It seems even unfashionable to apply such heavy, huge, energy‐consuming, and totally costly instruments nowadays. Nevertheless, the good stability and easy quantification give that method the prevalence in large laboratories handling such fields as metallurgy, geological analyses, archaeometry, pollution, and environmental monitoring. The good spectral resolution for low‐energy X‐rays enables both the analyses of light elements up to Be and the chemical speciation. The steady progress of the WD‐XRF in the following, hardly expected fields is one of the most exciting questions: □ mapping option, which has been earlier considered unfeasible and now is executed, with especially good spectral resolution; □ nontrivial representation of results in the energy units; □ application of Artificial Intelligence (AI) for pattern recognition or quantification, sometimes without the need for the registration of the searched element; □ new possibilities of the dynamical measurements of the Pauling electronegativities for the elements of I and II Group of the Periodic System.