Wavefront reconstruction for multi-lateral shearing interferometry using difference Zernike polynomials fitting

Liu, Ke; Wang, Jiannian; Wang, Hai; Li, Yanqiu

doi:10.1016/j.optlaseng.2018.02.011

Cited by 13 publications

(3 citation statements)

References 36 publications

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“…In addition, the measured average spatial and temporal noise levels are 25.93 and 2.88 mrad/μm, respectively. With the phase reconstruction algorithm filtering the high-frequency spatial noise ( 46 ), the system has a high relative phase accuracy of 0.0021λ, defined as the root mean square error of the reconstructed reference plane wave (for more details, see text S11) ( 51 ). The maximum detectable phase gradient ∇φ max of the microscopy system is determined by the NA of the metalens and the shearing distance.…”

Section: Resultsmentioning

confidence: 99%

Single-shot deterministic complex amplitude imaging with a single-layer metalens

Li,

Wang,

Zhao

et al. 2024

Sci. Adv.

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Conventional imaging systems can only capture light intensity. Meanwhile, the lost phase information may be critical for a variety of applications such as label-free microscopy and optical metrology. Existing phase retrieval techniques typically require a bulky setup, multiframe measurements, or prior information of the target scene. Here, we proposed an extremely compact system for complex amplitude imaging, leveraging the extreme versatility of a single-layer metalens to generate spatially multiplexed and polarization phase–shifted point spread functions. Combining the metalens with a polarization camera, the system can simultaneously record four polarization shearing interference patterns along both in-plane directions, thus allowing the deterministic reconstruction of the complex amplitude light field in a single shot. Using an incoherent light-emitting diode as the illumination, we experimentally demonstrated speckle-noise–free complex amplitude imaging for both static and moving objects with tailored magnification ratio and field of view. The miniaturized and robust system may open the door for complex amplitude imaging in portable devices for point-of-care applications.

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Section: Resultsmentioning

confidence: 99%

Single-shot deterministic complex amplitude imaging with a single-layer metalens

Li,

Wang,

Zhao

et al. 2024

Sci. Adv.

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“…The aim of wavefront sensing is to simultaneously measure both the amplitude and phase of incident light. Wavefront information can be obtained using interferometry [1,2], coherent diffraction imaging [3,4], holography [5][6][7], wavefront sensing [8][9][10], and the intensity transfer equation [11].…”

Section: Introductionmentioning

confidence: 99%

High-precision Shack-Hartmann wavefront sensing with a multi-focal diffraction Taiji-lenslet array

Yang¹,

Zhang²,

Li³

et al. 2021

Laser Phys.

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A Hartmann wavefront sensor is a type of wavefront detection instrument that has been widely used in various fields. Traditional Hartmann wavefront sensors usually comprise a monofocal refraction lenslet array to segment the wavefront at the entrance pupil. Each wavelet is focused at the focal plane along the projection of the lenslet, forming the foci array. Unlike the multifocal self-interference Taiji-lenslet array, a type of multifocal diffraction Taiji-lenslet array was proposed in this study to improve the measurement accuracy using the weighted centroid location algorithm of these multifocal spots, where the latter is more easily designed than the former. An optical experiment was implemented using the multifocal diffraction Taiji-lenslet array to verify its effectiveness. As a type of diffractive lens, a large-aperture Taiji-lenslet array can be easily fabricated via lithography, which has great potential for application in the measurement of large-scale laser beams and optical elements.

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“…Wavefronts are often expressed in the form of Zernike polynomials, with each term representing a specific type of aberration. As these polynomials form a complete and orthogonal set with two variables (ρ and θ), the Zernike coefficients are independent of each other, making these functions very useful for analysis of the aberration characteristics of optical systems [11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Estimating transmitted wavefronts in a broad bandwidth based on Zernike coefficients

Zhang¹,

Wang²,

Wu³

et al. 2019

J. Opt.

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Existing technologies and methods for measuring transmitted wavefronts typically operate at only a few specific wavelengths. In this paper, we propose a new method for estimating the wavefront distortion of an optical transmission system in a broad bandwidth. We establish the relationship between the transmitted wavefront and wavelength, using Zernike fringe coefficients to represent the wavefront. From simulations of several different types of optical systems, we found that two formulas can be used to express Zernike-wavelength curves: the Conrady dispersion formula and a new formula that we have named the apochromatic characteristic formula. To reduce the influence of measurement errors on predictions, fitting method is biased in favor of simulation rather than experimental data. We illustrate the validity of this technique by reconstructing a wavefront transmitted at 671 nm using Zernike polynomials, demonstrating that the predicted wavefront is very similar to the wavefront measured experimentally. Using the Conrady formula, we illustrate that the wavefront of a monochromatic system can be predicted for any wavelength in a broad range, using data from three standard wavelengths. As Seidel coefficients correspond to Zernike coefficients, the relationship between optical aberration and wavelength detailed here can also be applied to areas, such as optical design, optical computing and adaptive optics.

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Wavefront reconstruction for multi-lateral shearing interferometry using difference Zernike polynomials fitting

Cited by 13 publications

References 36 publications

Single-shot deterministic complex amplitude imaging with a single-layer metalens

Single-shot deterministic complex amplitude imaging with a single-layer metalens

High-precision Shack-Hartmann wavefront sensing with a multi-focal diffraction Taiji-lenslet array

Estimating transmitted wavefronts in a broad bandwidth based on Zernike coefficients

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