2004
DOI: 10.1117/1.1637594
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Water immersion optical lithography at 193 nm

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Cited by 16 publications
(8 citation statements)
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“…Nevertheless, the narrowest nanoslit (10-nm wide) for the lens is presently still very difficult to fabricate in a 400-nm-thick gold film. On the other land, the immersion lenses can improve the resolution limit of the given operating wavelength by filling the object space with a high-index material, which are widely used in optical ultrahighresolution imaging and microscopy, high-throughput nanolithography, and high-density optical data storage, e.g., water immersion lithography [19], oil, and solid immersion microscopes [20,21].…”
Section: Introductionmentioning
confidence: 99%
“…Nevertheless, the narrowest nanoslit (10-nm wide) for the lens is presently still very difficult to fabricate in a 400-nm-thick gold film. On the other land, the immersion lenses can improve the resolution limit of the given operating wavelength by filling the object space with a high-index material, which are widely used in optical ultrahighresolution imaging and microscopy, high-throughput nanolithography, and high-density optical data storage, e.g., water immersion lithography [19], oil, and solid immersion microscopes [20,21].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, in order to increase the depth of focus (DOF) at current 193 nm photolithography systems, there is a need to develop new immersion fluids that have a higher refractive index than water with acceptable transparency at 193 nm since water is known as the best fluid for 193 nm immersion systems so far. 4 The goals of the research reported here are the discovery of aqueous systems possessing an index of refraction substantially greater than that of water at 193 nm and acceptable transparency at 193 nm and compatibility with pertinent photoresist systems employed at 193 nm. 4 Our initial investigation was performed with aqueous surfactant system because there are some potential benefits we could achieve by using surfactant systems.…”
Section: Na = N Sin θmentioning
confidence: 99%
“…4 The goals of the research reported here are the discovery of aqueous systems possessing an index of refraction substantially greater than that of water at 193 nm and acceptable transparency at 193 nm and compatibility with pertinent photoresist systems employed at 193 nm. 4 Our initial investigation was performed with aqueous surfactant system because there are some potential benefits we could achieve by using surfactant systems. These are: (1) Surfactants can be used in aqueous system which has the highest index of refraction and optical property so far, (2) Resists for 193 nm are known to be compatible with the surfactant systems to be investigated, (3) Surfactant micelles can scavenge materials leached from the resist and keep them dispersed and prevent redeposit of materials and formation of defects on the resist, (4) The proposed systems have established photostability and good environmental characteristics, (5) The proposed systems will allow a wide variation of structural modifications employing inexpensive, commercially available materials.…”
Section: Na = N Sin θmentioning
confidence: 99%
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“…2 Therefore, for current 193 nm photolithography systems, there is a need to develop new immersion fluids that have a higher refractive index than water n = 1.44. 3 In addition, candidates must have an acceptable transparency at 193 nm. Recently, second generation fluids with a refractive index of ~ 1.6 at 193 nm have been prepared, driven by the growing interest in this area.…”
Section: Introductionmentioning
confidence: 99%