2022
DOI: 10.1039/d1ma01225h
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Wafer-scale pulsed laser deposition of ITO for solar cells: reduced damage vs. interfacial resistance

Abstract: Transparent conducting oxides (TCOs) used in solar cells must be optimized to achieve minimum parasitic absorption losses while providing sufficient lateral conductivity. Low contact resistance with the adjacent device layers...

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Cited by 17 publications
(11 citation statements)
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“…Similar trends in transmission spectra of PLD-deposited ITO films as a function of chamber pressure and thickness were observed by Kim et al for ITO films deposited at 300 °C [44] and by Smirnov et al for PLD ITO deposited at room temperature. [34] As expected, the sheet resistance increases for the lessdense films deposited at higher chamber pressures (Figures S4 and S5, supporting information). In fact, a surprisingly linear correlation is observed between the PLD chamber pressure and the logarithmic of the sheet resistance and conductivity (Figure S5B-D, Supporting Information).…”
Section: Ito Film Characterizationsupporting
confidence: 73%
See 1 more Smart Citation
“…Similar trends in transmission spectra of PLD-deposited ITO films as a function of chamber pressure and thickness were observed by Kim et al for ITO films deposited at 300 °C [44] and by Smirnov et al for PLD ITO deposited at room temperature. [34] As expected, the sheet resistance increases for the lessdense films deposited at higher chamber pressures (Figures S4 and S5, supporting information). In fact, a surprisingly linear correlation is observed between the PLD chamber pressure and the logarithmic of the sheet resistance and conductivity (Figure S5B-D, Supporting Information).…”
Section: Ito Film Characterizationsupporting
confidence: 73%
“…[31] With increasing the chamber pressure, the background gas inside the chamber decreases the kinetic energy of the ablated species in the plasma via thermalization, hence the impact of the deposition on the substrate is expected to be less damaging. [17] Despite its encouraging perspectives, there are just a few reports on the successful usage of PLDdeposited TCOs on thin-film photovoltaic devices, such as AZO, GZO, and B-doped ZnO bottom-contacts for a Cu(In,Ga)Se 2 thinfilm solar cell, [32] and AZO or GZO top-electrodes for organic solar cells, [3,33] as well as IZrO and ITO as the top-electrode on PSCs, [2,34] and perovskite-based tandem solar cells. [35] However, in these perovskite device examples, the PCE did not exceed 15%.…”
Section: Introductionmentioning
confidence: 99%
“…In particular, PLD allows to tune the optoelectronic characteristics by controlling the chamber pressure and introducing oxygen or an inert gas in the vacuum chamber. Besides, PLD is a scalable, high throughput manufacturing technology that can produce conformal compact films on flat and textured surfaces and allow for precise control of thickness. Moreover, recently we demonstrated that PLD is a method that allows for soft deposition of metal oxide film without damaging underlaying organic or perovskite based semiconductors. , Despite its encouraging perspectives, there is only one example in the literature of PLD being employed to deposit SnO 2 ETLs, in which Chen et al demonstrated that the amorphous nature of the films deposited by PLD is suitable for flexible photovoltaics . In that work, an average PCE of 16.3% was obtained, yet the devices suffered from fairly high series and low shunt resistances due to the low conductivity and slightly rough surface of the SnO 2 films, respectively, which limited the fill factor (FF) to 70% on average.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, recently we demonstrated that PLD is a method that allows for soft deposition of metal oxide film without damaging underlaying organic or perovskite based semiconductors. 26,27 Despite its encouraging perspectives, there is only one example in the literature of PLD being employed to deposit SnO 2 ETLs, in which Chen et al demonstrated that the amorphous nature of the films deposited by PLD is suitable for flexible photovoltaics. 28 In that work, an average PCE of 16.3% was obtained, yet the devices suffered from fairly high series and low shunt resistances due to the low conductivity and slightly rough surface of the SnO 2 films, respectively, which limited the fill factor (FF) to 70% on average.…”
Section: ■ Introductionmentioning
confidence: 99%
“…[23] In addition, low damage deposition of tin-and zirconium-doped indium oxides (ITO & IZrO) by PLD as the top electrodes in p-i-n PSCs has been demonstrated in a number of studies. [24,25] This stems from the possibility to use a broad range of deposition pressures and laser energy densities to mitigate the kinetic energy of the ablated species arriving to the substrate.…”
Section: Introductionmentioning
confidence: 99%