2016
DOI: 10.1016/j.apsusc.2016.01.038
|View full text |Cite
|
Sign up to set email alerts
|

Wafer-scale, conformal and direct growth of MoS2 thin films by atomic layer deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

3
86
0
1

Year Published

2016
2016
2021
2021

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 121 publications
(90 citation statements)
references
References 38 publications
3
86
0
1
Order By: Relevance
“…While not as high as FETs with shorter channel length, this is an excellent demonstration of the new scales of electronics permitted by film growths. The growths mentioned thus far utilized inorganic precursors: MoCl 5 and H 2 S. Jang et al [60] used an organic Mo precursor, which enabled further lowering of the growth temperature to 200 • C. This growth rivaled MOCVD efforts, with a monolayer film 10 centimeters in diameter achieved on a sapphire substrate. The sequential depositing strategy of ALD helped avoid a major pitfall of MOCVD: Jang et al [60] observed little carbon contamination in their final sample.…”
Section: Atomic Layer Deposition (Ald)mentioning
confidence: 99%
See 2 more Smart Citations
“…While not as high as FETs with shorter channel length, this is an excellent demonstration of the new scales of electronics permitted by film growths. The growths mentioned thus far utilized inorganic precursors: MoCl 5 and H 2 S. Jang et al [60] used an organic Mo precursor, which enabled further lowering of the growth temperature to 200 • C. This growth rivaled MOCVD efforts, with a monolayer film 10 centimeters in diameter achieved on a sapphire substrate. The sequential depositing strategy of ALD helped avoid a major pitfall of MOCVD: Jang et al [60] observed little carbon contamination in their final sample.…”
Section: Atomic Layer Deposition (Ald)mentioning
confidence: 99%
“…The growths mentioned thus far utilized inorganic precursors: MoCl 5 and H 2 S. Jang et al [60] used an organic Mo precursor, which enabled further lowering of the growth temperature to 200 • C. This growth rivaled MOCVD efforts, with a monolayer film 10 centimeters in diameter achieved on a sapphire substrate. The sequential depositing strategy of ALD helped avoid a major pitfall of MOCVD: Jang et al [60] observed little carbon contamination in their final sample. While this low temperature growth lead to domains on the scale of nanometers, this may be an acceptable price to pay [60] Some applications may demand growing material directly on substrates that are either temperature sensitive themselves (such as flexible substrates) or on substrates with temperature sensitive components upon them (such as photoresists).…”
Section: Atomic Layer Deposition (Ald)mentioning
confidence: 99%
See 1 more Smart Citation
“…In the case of MoS 2 films, in vacuum and inert environments, the COF can reach values of 0.005 and 0.05, respectively [6,7], with wear values on the order of 10 -8 mm 3 N -1 m -1 for several counter-pairs [6]. On the other hand, WS 2 films exhibit great thermal stability, a working temperature higher than that exhibited by MoS 2 (approximately 100 °C) and COFs between 0.02 and 0.06 under controlled conditions [8,9].…”
Section: Introductionmentioning
confidence: 99%
“…Chemisorption and self-limiting chemical reactions of ALD can provide MoS 2 film with strong interaction to the substrate and controllable number of layers (NL). [14][15][16][17][18][19][20] This strong interaction can bind MoS 2 film strongly to the substrate, which can ensure it does not fall off in the lubrication process. 21 ALD of MoS 2 contains four steps: pulse and purge molybdenum precursor, pulse and purge sulfur precursor, which mean the MoS 2 film with desired thickness can be got by repeating these steps.…”
mentioning
confidence: 99%