2018
DOI: 10.1109/tcsii.2018.2852949
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Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas

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Cited by 5 publications
(4 citation statements)
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“…The biomedical related WPTs [13][14][15][16][17] could transfer the power through a greater distance with a very large TX chip size. The wafer-level testing related WPTs [2,18,19] performs the power delivery in a much shorter distance, but the TX chip area is much smaller. When the trade-off between the TX chip size and the delivered distance is eliminated, small RX chip size and maximum power delivery are the most critical factors required for both biomedical WPTs and wafer-level testing WPTs.…”
Section: Simulation Results Of a Multi-channel Sub-thz Wpt Interfacementioning
confidence: 99%
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“…The biomedical related WPTs [13][14][15][16][17] could transfer the power through a greater distance with a very large TX chip size. The wafer-level testing related WPTs [2,18,19] performs the power delivery in a much shorter distance, but the TX chip area is much smaller. When the trade-off between the TX chip size and the delivered distance is eliminated, small RX chip size and maximum power delivery are the most critical factors required for both biomedical WPTs and wafer-level testing WPTs.…”
Section: Simulation Results Of a Multi-channel Sub-thz Wpt Interfacementioning
confidence: 99%
“…When the trade-off between the TX chip size and the delivered distance is eliminated, small RX chip size and maximum power delivery are the most critical factors required for both biomedical WPTs and wafer-level testing WPTs. The proposed WPT RX chip occupies only 0.098 mm 2 area (5 times smaller than the smallest one [19]). The maximum power delivery of the proposed WPT is 20 mW (only [16] could provide 4 times more power, but the RX chip size is 367 times larger).…”
Section: Simulation Results Of a Multi-channel Sub-thz Wpt Interfacementioning
confidence: 99%
“…One AoC for the wearable applications has also been presented [126]. Likewise, one AoC for the contactless testing of the ICs in the fabrication phase has also been proposed [127].…”
Section: Application In Low-frequency Bandsmentioning
confidence: 99%
“…• RFID and AoCs based ICs measurement setup: In [127], a novel method has been proposed at 965 MHz with the help of RFID and an array of post-processed coil AoCs, which empowers a contact-less measurement of the ICs at the wafer level. The method is more economical than the conventional I/O pads based testing of the large ICs because of its small chip-area consumption and low-cost post-processing of the AoCs.…”
Section: ) Novel Measurement Setups For Ics Using Aocs For the Mitigation Of Constraints Posed By The Conventional Setups: Potentials Chamentioning
confidence: 99%