2022
DOI: 10.1145/3555048
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Voltage Sensor Implementations for Remote Power Attacks on FPGAs

Abstract: This paper presents a study of two types of on-chip FPGA voltage sensors based on ring oscillators (ROs) and time-to-digital converter (TDCs), respectively. It has previously been shown that these sensors are often used to extract side-channel information from FPGAs without physical access. The performance of the sensors is evaluated in the presence of circuits that deliberately waste power, resulting in localized voltage drops. The effects of FPGA power supply features and sensor sensitivity in detecting volt… Show more

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Cited by 11 publications
(11 citation statements)
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“…R ING oscillators (ROs) are well established circuits widely adopted as basic building blocks in several applications, ranging from hardware security [1], [2], [3], [4], [5], [6], [7] to ON-chip testing and aging monitoring [8], [9], [10], [11]. An RO is able to generate an oscillatory signal by cascading an odd number of inverting stages, thus resulting in a highly flexible and compact solution compared with other oscillatory sources, such as LC resonators [12], [13].…”
Section: Introductionmentioning
confidence: 99%
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“…R ING oscillators (ROs) are well established circuits widely adopted as basic building blocks in several applications, ranging from hardware security [1], [2], [3], [4], [5], [6], [7] to ON-chip testing and aging monitoring [8], [9], [10], [11]. An RO is able to generate an oscillatory signal by cascading an odd number of inverting stages, thus resulting in a highly flexible and compact solution compared with other oscillatory sources, such as LC resonators [12], [13].…”
Section: Introductionmentioning
confidence: 99%
“…An RO is able to generate an oscillatory signal by cascading an odd number of inverting stages, thus resulting in a highly flexible and compact solution compared with other oscillatory sources, such as LC resonators [12], [13]. Such properties are crucial for the abovementioned applications, where ROs are mainly used to measure the effects of manufacturing process variations [1], [2], [3], [4], [5] or to detect performance degradation [7], [8], [9], [10].…”
Section: Introductionmentioning
confidence: 99%
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