2018
DOI: 10.1016/j.egypro.2018.06.023
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Voltage Security Assessment by Using PFDT and CBR Methods in Emerging Power System

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Cited by 8 publications
(5 citation statements)
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“…Small test systems used in the literature are the IEEE 4-bus test system (Abbass et al, 2023), the IEEE 9-bus test system (Bahbah & Girgis, 2004;Goh et al, 2015;Hossain & Kumar, 2023;C. Xu et al, 2005), the IEEE 14bus power system (Adewuyi, Shigenobu, Ooya, Senjyu, & Howlader, 2019;Ali et al, 2015;Dharmapala et al, 2020;Goh et al, 2015;Innah & Hiyama, 2011;Jayasankar et al, 2010;Ortiz-Villalba et al, 2020;Pannell et al, 2018;Pérez-Londoño et al, 2017;, the IEEE 24-bus power system (Y. , the IEEE 30-bus power system (Ali et al, 2015;Jain et al, 2003;Mukherjee & De, 2020;Nandanwar et al, 2018;Pérez-Londoño et al, 2017;Suganyadevi et al, 2016;Suliman & Rahman, 2010;, the IEEE 39-bus New England (Adewole & Tzoneva, 2017;Azman et al, 2020;Bahmanyar & Karami, 2014;Bo et al, 2014;Cepeda et al, 2014;Chen et al, 2019;Echeverría et al, 2017;Frimpong et al, 2017;Gomez et al, 2011;Gu & Li, 2013;Hashiesh et al, 2012;Hossain & Kumar, 2023;Hu et al, 2019;F. Li et al, 2021;Y.…”
Section: Test Systemsmentioning
confidence: 99%
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“…Small test systems used in the literature are the IEEE 4-bus test system (Abbass et al, 2023), the IEEE 9-bus test system (Bahbah & Girgis, 2004;Goh et al, 2015;Hossain & Kumar, 2023;C. Xu et al, 2005), the IEEE 14bus power system (Adewuyi, Shigenobu, Ooya, Senjyu, & Howlader, 2019;Ali et al, 2015;Dharmapala et al, 2020;Goh et al, 2015;Innah & Hiyama, 2011;Jayasankar et al, 2010;Ortiz-Villalba et al, 2020;Pannell et al, 2018;Pérez-Londoño et al, 2017;, the IEEE 24-bus power system (Y. , the IEEE 30-bus power system (Ali et al, 2015;Jain et al, 2003;Mukherjee & De, 2020;Nandanwar et al, 2018;Pérez-Londoño et al, 2017;Suganyadevi et al, 2016;Suliman & Rahman, 2010;, the IEEE 39-bus New England (Adewole & Tzoneva, 2017;Azman et al, 2020;Bahmanyar & Karami, 2014;Bo et al, 2014;Cepeda et al, 2014;Chen et al, 2019;Echeverría et al, 2017;Frimpong et al, 2017;Gomez et al, 2011;Gu & Li, 2013;Hashiesh et al, 2012;Hossain & Kumar, 2023;Hu et al, 2019;F. Li et al, 2021;Y.…”
Section: Test Systemsmentioning
confidence: 99%
“…Mohammadi, Khademi, Simon, & Dehghani, 2016;M. Mohammadi, Gharehpetian, & Niknam, 2010;Mukherjee & De, 2020;Naderi, Javadi, Mazhari, & Chung, 2023;Nandanwar, Kolhe, Warkad, Patidar, & Singh, 2018;Nandanwar & Warkad, 2016;Nie, Yang, Centeno, & Jones, 2017;Nuqui, Phadke, Schulz, & Bhatt, 2001;Pannell, Ramachandran, & Snider, 2018;Rahmatian, Chen, Palizban, Moshref, & Dunford, 2017;Ren, Wang, Yu, Xu, & Dong, 2023;Ren, Yuan, Li, Zhang, & Xu, 2023;Rovnyak, Kretsinger, Thorp, & Brown, 1994;Rovnyak, Taylor, & Sheng, 2000;Senroy, Heydt, & Vittal, 2006;Sun et al, 2008;Teeuwsen, Erlich, & El-Sharkawi, 2005;Y. Yang et al, 2017;R.…”
Section: Types Of Techniquementioning
confidence: 99%
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“…e GTEP should be done to meet the high energy demand and electricity consumption surges at peak-load circumstances such as holidays when voltage collapses are highly likely. One solution is to advise and take action beforehand [7]. By utilizing suitable models for GTEP, the abovementioned objectives can be satisfied.…”
Section: Introductionmentioning
confidence: 99%