2019
DOI: 10.7567/1347-4065/ab4563
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Voltage-induced coercivity change in Co film grown on Cr2O3 barrier

Abstract: We investigated the electric field effect on the magnetic properties of the Pt or Ru/Cr2O3/Co/Pt structures fabricated by molecular beam epitaxy (MBE). The Cr2O3 layer fabricated using radical assisted MBE exhibits a high breakdown voltage (∼1.5 MV cm−1) comparable to the thicker films. Owing to interfacial perpendicular magnetic anisotropy, the Co layer exhibits a sufficiently large magnetic anisotropy energy (Keff > 1 × 106 J m−3). Further, a voltage-induced coercivity change is observed for the structure, w… Show more

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Cited by 4 publications
(6 citation statements)
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“…After backfilling with SiO 2 , the Cr/Au top electrode was formed. The micro-fabrication process is identical to that in our previous report 26 . After the microfabrication, the samples were post annealed at up to 400 °C in a vacuum furnace.…”
Section: Methodsmentioning
confidence: 98%
See 1 more Smart Citation
“…After backfilling with SiO 2 , the Cr/Au top electrode was formed. The micro-fabrication process is identical to that in our previous report 26 . After the microfabrication, the samples were post annealed at up to 400 °C in a vacuum furnace.…”
Section: Methodsmentioning
confidence: 98%
“…While MgO (111) single dielectric layer 18 , 19 and MgO (111)/amorphous HfO x bilayer dielectric layers 20 25 have been sometimes used for the voltage effect study, the large mismatch between MgO (111) and Co (111) and the natural polar plane of MgO make the realization of a high-quality interface difficult. Other crystal dielectric layers, such as Cr 2 O 3 26 and SrTiO 3 27 , with less lattice mismatch, are difficult to grow on Co without degradation. An amorphous dielectric layer is another option, which can be used without concerning the lattice mismatch.…”
mentioning
confidence: 99%
“…[13][14][15] To apply an extremely strong electric field on the surface, studies on the VCMA effect using an ionic liquid have also been conducted. [16][17][18] Although many experimental studies on the VCMA effect have been conducted, the sign of the VCMA effect in most materials is negative (see Figure 1), [2] and only a few materials exhibit a positive VCMA effect at room temperature; L1 0 -ordered FePd alloys [10,19] and Co/oxide structures such as Co/CoO x /HfO 2 , [20] Co/SrTiO 3 , [21,22] Co/Cr 2 O 3 , [23] and Co/CoO x /TiO x junctions. [24] A positive VCMA has also been reported for Co(0.4 nm)/MgO/ HfO 2 [25] and Ru/CoFeB/MgO structures with sputter-deposited MgO barrier.…”
mentioning
confidence: 99%
“…While MgO (111) single dielectric layer 17,18 and MgO (111)/amorphous HfO x bilayer dielectric layers [19][20][21][22][23][24] have been sometimes used for the voltage effect study, the large mismatch between MgO (111) and Co (111) and the natural polar plane of MgO make the realization of a high-quality interface difficult. Other crystal dielectric layers, such as Cr 2 O 3 25 and SrTiO 3 , 26 with less lattice mismatch, are difficult to grow on Co without degradation. An amorphous dielectric layer is another option, which can be used without concerning the lattice mismatch.…”
mentioning
confidence: 99%
“…After backfilling with SiO 2 , the Cr/Au top electrode was formed. The micro-fabrication process is identical to that in our previous report 25. After the microfabrication, the samples were post annealed at up to 400 ℃ in a vacuum furnace.…”
mentioning
confidence: 99%