VNA frequency extenders to 1.1 THz

Crowe, T.W.; Foley, Brian M.; Durant, Steve; Hui, K.; Duan, Yiwei; Hesler, Jeffrey L.

doi:10.1109/irmmw-thz.2011.6105028

Cited by 28 publications

(17 citation statements)

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“…These waveguides also provide well-defined reference planes for making measurements at these frequencies and, as such, are found on measuring instruments such as Vector Network Analyzers (VNAs) operating at these frequencies (i.e. from 0.1 THz to 1 THz and beyond) [1].…”

Section: Introductionmentioning

confidence: 99%

Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths

Ridler

2017

2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT)

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Abstract-A series of documentary standards has recently been published (the IEEE 1785 series) that provides specification details for rectangular metallic waveguides used at frequencies from 110 GHz to at least 3.3 THz. This includes values of electrical loss (both reflection and transmission) for these waveguides. However, the values specified in these standards are based on calculated (i.e. modelled) performance and not measured values for real waveguide devices. This paper presents measured values of loss for commercially available waveguides in this frequency range. A comparison is given between the standardized values and values obtained from measurements made under precision laboratory conditions.

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Section: Introductionmentioning

confidence: 99%

Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths

Ridler

2017

2017 10th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT)

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“…The dynamic range of our optoelectronic spectrometer is already close to that of state-ofthe-art, frequency-extended RF systems. Crowe et al [24] reported on a frequency-extended A single waveguide band offers only a bandwidth of less than 20% of the center frequency. If a larger frequency range needs to be accessed, the complete extender setup has to be exchanged.…”

Section: Resultsmentioning

confidence: 99%

2.75 THz tuning with a triple-DFB laser system at 1550 nm and InGaAs photomixers

Deninger

Roggenbuck

Schindler

et al. 2014

J Infrared Milli Terahz Waves

115

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To date, exploiting the full bandwidth of state-of-the-art InGaAs photomixers for generation and detection of continuous-wave (CW) THz radiation (typ.~50 GHz to~3 THz) required complex and costly external-cavity diode lasers with motorized resonator control. Distributed feedback (DFB) lasers, by contrast, are compact and inexpensive, but the tuning range per diode is limited to~600 GHz at 1.5 μm. In this paper, we show that a combination of three DFB diodes covers the complete frequency range from 0-2750 GHz without any gaps. In combination with InGaAs-based photomixers for terahertz generation and detection, the system achieves a dynamic range of > 100 dB at 56 GHz, 64 dB at 1000 GHz, and 26 dB at 2500 GHz. A field-programmable gate array (FPGA)-based lock-in amplifier permits a flexible adjustment of the integration time from 0.5 ms to 600 ms. Employing an optimized "fast scan" mode, a spectrum of~1200 GHzthe bandwidth of each subset of two lasersand 40 MHz steps is acquired in less than one minute, still maintaining a reasonable dynamic range. To the best of our knowledge, the bandwidth of 2.75 THz presents a new record for DFB-based CW-terahertz systems.

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“…Presently, commercial millimeter-wave and THz VNAs operate at frequencies up to 1.1 THz [41]. However, development of the frequency multipliers and other components necessary for implementing VNA extender heads for use at even higher frequencies remains an active field, with one manufacturer recently announcing a 1.5 THz module.…”

Section: Thz Vnas: State-of-the-artmentioning

confidence: 99%

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

et al. 2017

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The two main modalities for making broadband phase-sensitive measurements at terahertz frequencies are Vector Network Analyzers (VNA) and Time Domain Spectrometers (TDS). These measuring instruments have separate and fundamentally different operating principles and methodologies, and they serve very different application spaces. The different architectures give rise to different measurement challenges and metrological solutions. This article reviews these two measurement techniques and discusses the different issues involved in making measurements using these systems. Calibration, verification and measurement traceability issues are reviewed, along with other major challenges facing these instrument architectures in the years to come. The differences in, and similarities between, the two measurement methods are discussed and analysed. Finally, the operating principles of ElectroOptic Sampling (EOS) are briefly discussed. This technique has some similarities to TDS and shares application space with the VNA.

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VNA frequency extenders to 1.1 THz

Cited by 28 publications

References 0 publications

Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths

Benchmarking electrical loss in rectangular metallic waveguide at submillimeter wavelengths

2.75 THz tuning with a triple-DFB laser system at 1550 nm and InGaAs photomixers

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

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