2022
DOI: 10.1002/aenm.202270052
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Visualizing Nucleation and Growth Process of Vanadium‐Supramolecular Nanoribbons Self‐Assembled by Rapid Cooling Method towards High‐Capacity Vanadium Nitride Anode Materials (Adv. Energy Mater. 13/2022)

Abstract: Anode Materials In article number 2103158, Fen Ran and co‐workers develop the efficient approach of rapid cooling in a refrigerator, for large‐scale fabrication of melamine‐ammonium metavanadate supramolecular nanoribbons. The vanadium‐supramolecules derived vanadium nitride/carbon nanoribbons present a mesoporous structure, which endow the fabricated vanadium nitride/carbon with high capacitance of 266.3 F g−1 at 0.5 A g−1.

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Cited by 7 publications
(5 citation statements)
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“…Compared with the Control and CBECV perovskite films, CBEV can significantly accelerate the extraction and collection of the hole from perovskite to HTL transport layer (Figure 5c). [ 61 ] This is attributed to the fact that CBEV undergoes a phase transition, diffusing from the interior of the perovskite to the surface of the perovskite film and passivating the surface defects. Through kelvin probe force microscopy (KPFM) measurements, the surface potential (the value is denoted as R a ) of CBEV perovskite films ( R a = 20.30 mV) is much higher than those of the CBECV (( R a = 16.50 mV) and Control perovskite films (( R a = 9.65 mV) (Figure 5d–f), which is consistent with Ultraviolet photoelectron spectroscopy (UPS) results (Figures S16 and S17, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…Compared with the Control and CBECV perovskite films, CBEV can significantly accelerate the extraction and collection of the hole from perovskite to HTL transport layer (Figure 5c). [ 61 ] This is attributed to the fact that CBEV undergoes a phase transition, diffusing from the interior of the perovskite to the surface of the perovskite film and passivating the surface defects. Through kelvin probe force microscopy (KPFM) measurements, the surface potential (the value is denoted as R a ) of CBEV perovskite films ( R a = 20.30 mV) is much higher than those of the CBECV (( R a = 16.50 mV) and Control perovskite films (( R a = 9.65 mV) (Figure 5d–f), which is consistent with Ultraviolet photoelectron spectroscopy (UPS) results (Figures S16 and S17, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…Space‐current‐limited current (SCLC) model was used to estimate the defect state density of the electron‐only devices (FTO/SnO 2 /perovskite/with or without 4‐APN/C 60 /Ag) (Figure 3c) and hole‐only devices (FTO/NiO x /perovskite/with or without 4‐APN/spiro‐OMeTAD/Ag) [50] (Figure 3d). At a low bias voltage, the kink point of the dark J ‐ V curve is identified as the trap‐filling limit voltage ( V TFL ) [51,52] .…”
Section: Resultsmentioning
confidence: 99%
“…As shown in Figure 5e, the unpacked PSMs were able to retain more than 96% of their initial PCE value after 620 h. These results highlight the incredible reliability and longevity of photovoltaic performance for the carbon‐based large‐area quasi‐two‐dimensional perovskite cell modules based on multifunctional CATNI interfacial engineering. [ 42 ]…”
Section: Resultsmentioning
confidence: 99%