Abstract:Utilizing four-dimensional scanning ultrafast electron microscopy (4D-SUEM) is a powerful tool to monitor charge dynamics at material surfaces and interfaces especially for the application in renewable energy field. Herein, we uncover unique physical features for 4D-SUEM upon reducing the acceleration of probed primary electrons to 1 keV, for wide range of materials including various single crystals, thin films and quantum dots upon the presence of oxidized and neat surfaces. Working at 1 keV helps to uncover … Show more
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