Visualization of oxygen vacancies at CeO
x
/Y-HZO interface by spectrum imaging method and multivariate analysis
Koichi Higashimine,
Mizuki Saito,
Mohit
et al.
Abstract:Electron energy loss spectroscopy - spectrum imaging measurements using a scanning transmission electron microscope are carried out to clarify the details of microstructure at the interface of the CeOx-capped Y-HZO film prepared by the chemical solution deposition method. We confirmed that by the present chemical solution deposition the independent capped layer of CeOx successively deposited on Y-HZO. The crystal structure of CeOx film is mainly the cubic CeO2 structure with Ce4+. Chemical state maps are also … Show more
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