2003
DOI: 10.1116/1.1585078
|View full text |Cite
|
Sign up to set email alerts
|

Virtual interface approximation model applied to spectroscopic ellipsometry for on-line composition determination of metalorganic chemical vapor deposition grown ternary nitrides

Abstract: Articles you may be interested inEffects of well width and growth temperature on optical and structural characteristics of AlN/GaN superlattices grown by metal-organic chemical vapor deposition Appl. Phys. Lett. 95, 201906 (2009); 10.1063/1.3267101GaN hybrid microcavities in the strong coupling regime grown by metal-organic chemical vapor deposition on sapphire substrates Ex situ spectroscopic ellipsometry investigation of the layered structure of polycrystalline diamond thin films grown by electron cyclotron … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
6
0

Year Published

2004
2004
2013
2013

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 9 publications
(6 citation statements)
references
References 19 publications
(10 reference statements)
0
6
0
Order By: Relevance
“…The samples have been continuously rotated during growth in order to promote the deposition homogeneity. High-resolution X-ray diffraction measurements gave for all the samples a full-width-at-the-half-maximum (FWHM) of 240-280 arcsec, comparable with state-of-theart device-quality nitride material [13]. The total Fe and Mg concentration in the layers has been determined via secondary-ion mass spectroscopy (SIMS).…”
Section: Methodsmentioning
confidence: 99%
“…The samples have been continuously rotated during growth in order to promote the deposition homogeneity. High-resolution X-ray diffraction measurements gave for all the samples a full-width-at-the-half-maximum (FWHM) of 240-280 arcsec, comparable with state-of-theart device-quality nitride material [13]. The total Fe and Mg concentration in the layers has been determined via secondary-ion mass spectroscopy (SIMS).…”
Section: Methodsmentioning
confidence: 99%
“…37 The broadening of the GaN(0002) reflex is found to depend both on the iron doping level and on the growth temperature. The minimum FWHM is obtained for the lowest Cp 2 Fe flow rate, 50 sccm, and the highest growth temperature, 950 • C. Despite the importance of HRXRD for the routine structural characterization of the layers, the inadequacy of standard X-ray diffraction methods for nanoscale investigations (detection of the presence of non-uniform magnetic ion distribution) is already widely accepted.…”
Section: High-resolution X-ray Diffractionmentioning
confidence: 99%
“…The CPA is only valid for absorbing layers and thus only channels lying above both band gaps can be used for our calculations. Constant values for GaN are followed by damped oscillations during AlGaN growth, which describe converging spirals when hiis plotted in the complex plane [5,11]. The spiral convergence points represent the dielectric function of the AlGaN compound for the respective wavelength.…”
Section: Resultsmentioning
confidence: 99%
“…We recently reported on the implementation of an algorithm based on the virtual interface approximation model for the determination of layer compositions of AlGaN in real-time [4,5]. In the present paper, we extend the in situ monitoring capability 11.192 by performing on-line SE measurements with a multiple wavelength ellipsometer.…”
Section: Introductionmentioning
confidence: 91%