VIOMAP, the S-parameter equivalent for weakly nonlinear RF and microwave devices

Verbeyst, Frans; Bossche, Marc Vanden

doi:10.1109/mwsym.1994.335156

Cited by 19 publications

(11 citation statements)

References 3 publications

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“…Assume u s (t) = 0 and let v L (t) be the resulting solution that also satisfies the twopoint constraint (31). Linearizing (5) about v L (t) yields a time-varying linear system (44) that can be solved for v s (t) if u s (t) is small.…”

Section: Shooting Methods Small-signal Analysismentioning

confidence: 99%

“…A new area of effort is expected to be in using the existing methods to generate high level models of individual blocks that will allow more general methods to simulate the whole system. Examples of this new trend include using Volterra series to model the nonlinear behavior of RF blocks [44] and using the small-signal time-varying noise analyses on the individual blocks in a phase-locked loop to generate behavioral models that include jitter [3,19], which allows accurate and efficient noise prediction for frequency synthesizers.…”

Section: B Strengths Of Shooting Methodsmentioning

confidence: 99%

“…Distributed compon en ts such as lossy and dispersive transmission lines and interpolated tables of Sparameters from either measurements or electromagnetic simulators are examples of linear models that are handled easily and efficiently with harmonic balance. Nonlinear frequency domain models are based on Volterra series and are derived either from simulation or from measurement [44]. In addition, it is becoming more common for abstract behavioral models to be written directly in the frequency domain.…”

Section: A Strengths Of Harmonic Balancementioning

confidence: 99%

See 2 more Smart Citations

Simulation Methods for RF Integrated Circuits

Rutenbar¹,

Gielen²,

Antao³

2009

Computer-Aided Design of Analog Integrated Circuits and Systems

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The principles employed in the development of modern RF simulators are introduced and the various techniques currently in use, or expected to be in use in the next few years, are surveyed. Frequencyand time-domain techniques are presented and contrasted, as are steady-state and envelope techniques and large-and small-signal techniques. Passing a narrowband signal though a nonlinear circuit results in a broadband signal whose spectrum is relatively sparse, as shown in Figure 1. In general, this spectrum consists of clusters of frequencies near the harmonics of

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Section: Shooting Methods Small-signal Analysismentioning

confidence: 99%

Section: B Strengths Of Shooting Methodsmentioning

confidence: 99%

Section: A Strengths Of Harmonic Balancementioning

confidence: 99%

See 1 more Smart Citation

Simulation Methods for RF Integrated Circuits

Rutenbar¹,

Gielen²,

Antao³

2009

Computer-Aided Design of Analog Integrated Circuits and Systems

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“…Using a Volterra series decomposition [9], and assuming that the harmonics generated by the CW source are low enough to not contribute to the non-linearities of the CPW line, the extracted harmonic components due to the RF transmission line only were calculated using the following formula:…”

Section: Harmonic Distortion Characterization For Hr-si Substratementioning

confidence: 99%

Impact of Si substrate resistivity on the non-linear behaviour of RF CPW transmission lines

Neve

Lederer

Pailloncy³

et al. 2008

2008 European Microwave Integrated Circuit Conference

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Non-linear behaviour of RF coplanar transmission lines is analyzed for various values of Si substrate resistivitiy.Based on small-signal measurements performed under different DC bias conditions, voltage dependent capacitance and conductance per unit length of the transmission line are extracted and compared for several silicon substrates. Harmonic distortion of large RF signal at 900 MHz along CPW lines is measured using a spectrum analyzer based setup as well as with a LSNA which gives us access to the phase of the harmonic components. For an input power of +25dBm, the highest harmonic component (2 nd ) is as high as -15, -57, -37 and -63 dBm for resistivity substrates of 20, 500, 5k and 2k-cm, respectively. A reduction of 45 and 15 dB for all harmonic components was obtained for the 5 and 2kcm HR-Si substrates, respectively, when a trap-rich passivation layer was used at the Si/SiO 2 interface, and for both characterization setups. The impact of the resistivity value on signal distortion with its relation to the bias-dependence substrate characteristic and the efficiency of the trap mechanism of the passivation layer are for the first time introduced from experimental result considerations.

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“…In fact, many measurement techniques that allow one to accurately characterize the transistor nonlinear behavior under realistic operation exist (e.g., Refs. ), but they do not belong to waveform engineering approaches.…”

Section: Introductionmentioning

confidence: 99%

Waveform engineering: State-of-the-art and future trends (invited paper)

Raffo

Vadalà

Bosi

et al. 2016

Int. J. RF Microw. Comput. Aided Eng.

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The term waveform engineering denotes all those circuit design techniques that are based on shaping the transistor voltage and current waveforms. From a general perspective, these design techniques can be grouped in two main categories according to the adopted design tool: measurement- and model-based. In the last two decades, thanks to the proliferation of setups enabling calibrated waveform acquisition at microwave frequencies, waveform engineering has attracted continuously increasing interest in the microwave engineering community. In this article, a comprehensive analysis of the waveform-engineering based design techniques is reported, paying particular attention to the advantages and drawbacks associated to each approach

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VIOMAP, the S-parameter equivalent for weakly nonlinear RF and microwave devices

Cited by 19 publications

References 3 publications

Simulation Methods for RF Integrated Circuits

Simulation Methods for RF Integrated Circuits

Impact of Si substrate resistivity on the non-linear behaviour of RF CPW transmission lines

Waveform engineering: State-of-the-art and future trends (invited paper)

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