2022
DOI: 10.1021/acs.jpca.2c04426
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Vibrationally-Resolved X-ray Photoelectron Spectra of Six Polycyclic Aromatic Hydrocarbons from First-Principles Simulations

Abstract: Vibrationally resolved C 1s X-ray photoelectron spectra (XPS) of a series of six polycyclic aromatic hydrocarbons (PAHs; phenanthrene, coronene, naphthalene, anthracene, tetracene, and pentacene) were computed by combining the full core hole density functional theory and the Franck−Condon simulations with the inclusion of the Duschinsky rotation effect. Simulated spectra of phenanthrene, coronene, and naphthalene agree well with experiments both in core binding energies (BEs) and profiles, which validate the a… Show more

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Cited by 5 publications
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“…The calculated fine structure components of the C1s ionization energies of PEN molecules are in excellent agreement with previous theoretical works. 54,55 Similarly, also the C−F-related C1s core levels reveal a fine structure for the various carbon atoms near the fluorination position, which is sometimes referred to as a second-order chemical shift. While the current experimental energy resolution does not allow us to resolve such fine structures of the C−C/C-H and C−F sublevels, as was possible in previous high-resolution XPS measurements for PEN, 54 all calculated ionization energies (see SI, Tables S2−S14) have been broadened by Gaussians (σ = 0.35 eV) to allow comparison with the measured XPS signatures.…”
mentioning
confidence: 99%
“…The calculated fine structure components of the C1s ionization energies of PEN molecules are in excellent agreement with previous theoretical works. 54,55 Similarly, also the C−F-related C1s core levels reveal a fine structure for the various carbon atoms near the fluorination position, which is sometimes referred to as a second-order chemical shift. While the current experimental energy resolution does not allow us to resolve such fine structures of the C−C/C-H and C−F sublevels, as was possible in previous high-resolution XPS measurements for PEN, 54 all calculated ionization energies (see SI, Tables S2−S14) have been broadened by Gaussians (σ = 0.35 eV) to allow comparison with the measured XPS signatures.…”
mentioning
confidence: 99%