VHDL-AMS based modeling and simulation of mixed-technology microsystems: a tutorial

Никитин, П.В.; Shi, C.-J.R.

doi:10.1016/j.vlsi.2005.12.002

Cited by 29 publications

(16 citation statements)

References 39 publications

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“…Moreover, structure of the system is less complex which may result in reduction of simulation time [3,17] . On moving from bottom to top the structure, the circuit model becomes simpler and the simulation speed can be increased significantly.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…The connection pins of these models carry physical signals, which are subjected to conservation laws. These are Kirchhoff's current and voltage law in electrical systems; at the functional level, complex elements such as data acquisition or even model blocks are available, but the conservation laws are not available at connection pins, that is, signals are not physical any more [17,22] .…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…However, the gate open is more difficult to model, especially when floating capacitors are produced. One way to approach the problem is to set up voltage in the real device on this capacitor in order to implement simulation, for example [23] sets gate voltage to 0 V. Fault models can be written in either SPICE (e.g., HSPICE [24] ) or Hardware Description Language (HDL) such as VHDL-AMS [17,18] . However, the behavioral model in Ref.…”

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

“…During the last few years, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) techniques have been proposed for modern complex analogue and mixed mode system design due to its high speed [16][17][18] . Further details can be found in Section II.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Review of high level fault modeling approaches for mixed-signal systems

Xia

Ian

Antony

2010

J. Electron.(China)

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In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches.

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Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

Section: High Level Fault Modeling and Simulationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Review of high level fault modeling approaches for mixed-signal systems

Xia

Ian

Antony

2010

J. Electron.(China)

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“…But there still is a lack of behavioral models of RF components and antennas in particular, written with standardized Hardware Description Languages (HDLs) as the VHDL-AMS [2,3].…”

Section: Introductionmentioning

confidence: 99%

UHF RFID tag-antenna matching optimization using VHDL-AMS behavioral modeling

Khouri

Beroulle

Vuong

et al. 2006

Analog Integr Circ Sig Process

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In order to generate a first-time right design, system level modeling and simulation is a major step. Thus, optimization of integrated wireless systems requires the development of behavioral models of the RF link (antennamedium-antenna) compatible with the microelectronic design tools. Firstly, this paper shows the need of such models within the Top-Down design flow of an UHF RFID system. Then, a behavioral model of a narrow band far field RF link is presented and validated. This model is associated with a new behavioral model of an RFID tag and finally, several examples of tag-antenna matching optimization simulations are presented in order to demonstrate the interest of our approach.

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Modeling, design, and simulation of a radio frequency microelectromechanical system capacitive shunt switch

Jmai

Anacleto

Mendes

et al. 2017

Int J Numerical Modelling

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This tutorial paper presents an empirical model of a capacitive radio frequency microelectromechanical system switch in the microwave domain. The simulation results of the mechanical and electrical aspects of the proposed model were computed with Matlab. The mechanical modeling is validated by COMSOL software through the finite element method to determine the spring constant and the necessary applied voltage. The electromagnetic simulation results are validated by 3 different software: the High‐Frequency Structure Simulator based on the finite element method, the Computer Simulation Technology based on finite integration technique method, and the Advanced Design System based on the method of moments. The obtained results are performed in both down (OFF) and up (ON) states in the frequency range of 1 to 40 GHz, and the considered performance benchmarks are the insertion loss, return loss, isolation, and phase.

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VHDL-AMS based modeling and simulation of mixed-technology microsystems: a tutorial

Cited by 29 publications

References 39 publications

Review of high level fault modeling approaches for mixed-signal systems

Review of high level fault modeling approaches for mixed-signal systems

UHF RFID tag-antenna matching optimization using VHDL-AMS behavioral modeling

Modeling, design, and simulation of a radio frequency microelectromechanical system capacitive shunt switch

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