2016
DOI: 10.1063/1.4946828
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Very slow decay of a defect related emission band at 2.4 eV in AlN: Signatures of the Si related shallow DX state

Abstract: We report on a defect related luminescence band at 2.4 eV in aluminum nitride bulk crystals, for which we find strong indications to be related to silicon DX centers. Time resolved photoluminescence spectroscopy using a sub-bandgap excitation reveals two different recombination processes with very long decay times of 13 ms and 153 ms at low temperature. Based on the results of temperature and excitation dependent photoluminescence experiments, the process with the shorter lifetime is assigned to a donor-accept… Show more

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Cited by 19 publications
(41 citation statements)
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“…Figure shows the resultant PLE spectrum. We find an onset for pumping wavelengths λ<355nm (3.5 eV), and a maximum at around 310 nm (4.0 eV), similar to the PLE spectrum we found for the defect band centered at 2.4 eV in a recent publication . We consider this as a strong suggestion, that in both bands the same deep (acceptor) state must be involved, from which free carriers (electrons) are excited.…”
Section: Resultssupporting
confidence: 89%
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“…Figure shows the resultant PLE spectrum. We find an onset for pumping wavelengths λ<355nm (3.5 eV), and a maximum at around 310 nm (4.0 eV), similar to the PLE spectrum we found for the defect band centered at 2.4 eV in a recent publication . We consider this as a strong suggestion, that in both bands the same deep (acceptor) state must be involved, from which free carriers (electrons) are excited.…”
Section: Resultssupporting
confidence: 89%
“…We consider this as a hint, that the recombination characteristics are similar as those presented in Ref. . In the model presented there, the carriers recombine from a DX state spatially indirect to a deep acceptor for low temperatures, and via a donor‐acceptor pair transition for higher temperatures.…”
Section: Resultssupporting
confidence: 63%
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