“…However, as it was demonstrated later using time-dependent electromechanical measurements, the increased apparent piezoresistive coefficients were actually due to charge trapping and detrapping on the surface of depleted Si, whereas the intrinsic piezoresistvity of the nanostructured material is essentially the same as that of bulk (Milne et al, 2010). Recent studies on semiconducting metal oxide thin films and nanostructures, e.g., on TiO 2 (Fraga et al, 2012), MoO 3 (Wen et al, 2014), and ZnO (Kaps et al, 2017); as well as on layered transition metal dichalcogenides, e.g., MoS 2 (Nayak et al, 2014;Manzeli et al, 2015), MoSe 2 , WSe 2 (Hosseini et al, 2015), and PtSe 2 (Li et al, 2016;Wagner et al, 2018) showed highly strain dependent electronic properties, giving rise to quite high GFs comparable to those of Si and Ge (e.g. 441 for MoO 3 nanobelts, −148 for MoS 2 monolayers or −85 for PtSe 2 thin films).…”