Vertical X-ray confinement applicable to a time resolved XAFS method

Livins, Peteris; Thiel, Daniel; Stern, Edward A.; Lewis, Aaron

doi:10.1016/0168-9002(90)90070-m

Cited by 5 publications

(1 citation statement)

References 6 publications

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“…We discovered that the lensless optical solutions developed for near-field optics once again prove to be a unique advance in this important area of x-ray optics. Specifically, we have shown that accurately tapered hollow glass pipettes are ideal devices for concentrating, directing, and aperturing x-ray beams (Livins et al 1990;Stern et al 1988;Thiel et al 1989Thiel et al , 1992Thiel et al , 1993.…”

Section: Near-field Opticsmentioning

confidence: 99%

NSOM the fourth dimension: Integrating nanometric spatial and femtosecond time resolution

et al. 1995

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Summary: Photonic devices are becoming the cornerstone of next generation systems for computing and information processing. This paper reports on the first steps in the development of methods to understand these devices with nanometric (10 −7 cm) spatial and femtosecond (10 −15 s) time resolution. The basis of this achievement is the dramatic developments that have occurred in the past few years in a new area of optics called near-field optics. Near-field optics is a form of lensless optics with a resolution that is subwavelength and which is independent of the wavelength of the light being employed. We report in this paper the transmission of pulses with tens of femtosecond duration through subwavelength, near-field optical elements. We also report on a femtosecond near-field optical light source with cross-correlating capabilities and on the growth of GaAs in the tip of micropipettes for use as an ultrafast electro-optical switch which can cross-correlate optical, electrical, and electro-optical effects. These developments are especially relevant in the investigation of photonic devices since such devices can alter their characteristics as a function of size in the mesoscopic regime from just below lens-based optical resolutions to dimensions that approach atomic scales of ~1 nm (10 −7 cm). In view of the fact that these devices and the processes that govern them also exhibit ultrafast speeds, the combination of state of the art femtosecond laser spectroscopy with the unique features of near-field optics is a critical step in advancing our next generation understandings of such materials and structures so that their full potential in information processing can be achieved.

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Section: Near-field Opticsmentioning

confidence: 99%

NSOM the fourth dimension: Integrating nanometric spatial and femtosecond time resolution

et al. 1995

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Production of intense micrometer-sized x-ray beams with tapered glass monocapillaries

Thiel

Bilderback

Lewis

1993

Review of Scientific Instruments

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Methods were developed to characterize tapered capillaries as x-ray concentrators capable of forming spots of intense x-ray radiation with micrometer diameters. These tapered capillaries, with somewhat controlled tapers, were produced using a gravity-based capillary puller. A device was constructed to microscopically inspect these capillaries along two orthogonal axes in order to accurately measure the tapering and bending. Both monochromatic and white hard x rays were concentrated with a variety of tapered capillaries, and the subsequent gains in intensity (flux/area) ranging from 14 to 35 are reported. Using these unique x-ray concentrators, a simple high-powered x-ray fluorescence microscope was constructed and tested. We also found that hard x-ray beams could be successfully steered by bending the capillary tip with radii as small as 5 m. In addition, preliminary ray-tracing results obtained from a two-dimensional ray-tracing program are described.

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