2021
DOI: 10.1364/ome.431963
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Versatile butt-joint regrowth for dense photonic integration

Abstract: Butt-joint regrowth is widely used in photonic integration, but it has been challenging to break the density-quality tradeoff due to the edge growth rate enhancement (GRE) effect. In this work, we propose a scheme to circumvent this tradeoff by using large regrowth masks whose centers are exposed to epi-growth for neutralization of the excessive species. With the GRE under control, epi-stacks with arbitrarily large sizes supporting dense arrays can be butt-joint integrated with minimal compromise to their epit… Show more

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Cited by 5 publications
(3 citation statements)
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“…A butt-joint regrowth technique has been developed for arbitrary active component separation using an innovative open-mask approach. 167,168 The conceptual process flow of such open-mask butt-joint regrowth is illustrated in Fig. 8(a).…”
Section: Areal Optimization a Active-passive Integrationmentioning
confidence: 99%
See 1 more Smart Citation
“…A butt-joint regrowth technique has been developed for arbitrary active component separation using an innovative open-mask approach. 167,168 The conceptual process flow of such open-mask butt-joint regrowth is illustrated in Fig. 8(a).…”
Section: Areal Optimization a Active-passive Integrationmentioning
confidence: 99%
“…As a preliminary verification, a 0.5 × 1.7 mm 2 MQW-based active area is integrated with a passive i-InP material in the same horizontal plane using this technique. 167 Figure 8(b) shows the cross-sectional SEM image of such a butt-joint structure. The growth rate enhancement measured is of the same level as narrow stripes of 10 μm width.…”
Section: Areal Optimization a Active-passive Integrationmentioning
confidence: 99%
“…However, this large spacing between active components limits significantly the capability for high density integration. Recently, a new BJR fabrication scheme has been proposed to fabricate arbitrarily large areas of active material [23]. This method enables the fabrication of dense arrays of active devices.…”
Section: Introductionmentioning
confidence: 99%