“…In order to overcome these limitations, groups around the world have been developing instruments that combine synchrotron radiation with the high spatial resolution of different SPM variants (Okuda et al, 2005;Saito et al, 2006;Scheler et al, 2009;Rose & Freeland, 2010a;Fauquet et al, 2011;Pilet et al, 2012;Chan et al, 2013;Suzuki, 2015;Slobodskyy et al, 2015). Recently, synchrotron X-ray scanning tunneling microscopy (SX-STM) showed the capability to obtain elemental contrast with a lateral spatial resolution of only 2 nm and sensitivity at the limit of single-atomic height (Shirato et al, 2014).…”