Versatile atomic force microscopy setup combined with micro-focused X-ray beam

Slobodskyy, T.; Zozulya, Alexey; Tholapi, R.; Liefeith, L.; Fester, M.; Sprung, Michael; Hansen, W.

doi:10.1063/1.4922605

Cited by 10 publications

(10 citation statements)

References 18 publications

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“…Another decisive advantage of GISAXS measurements arises from the basic scattering geometry shown schematically in Figure 1 . The geometry comprises the necessary degrees of freedom orthogonal to the beam direction and therefore allows for combining the experimental setup with diverse deposition applications for thin films and/or with complementary measuring methods such as ellipsometry, spectroscopy or atomic force microscopy (AFM) [ 134 , 139 , 143 , 144 , 145 ].…”

Section: Combining Grazing Incidence X-ray Scattering and Sputter mentioning

confidence: 99%

Investigating Polymer–Metal Interfaces by Grazing Incidence Small-Angle X-Ray Scattering from Gradients to Real-Time Studies

Schwartzkopf

Roth

2016

Nanomaterials

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Tailoring the polymer–metal interface is crucial for advanced material design. Vacuum deposition methods for metal layer coating are widely used in industry and research. They allow for installing a variety of nanostructures, often making use of the selective interaction of the metal atoms with the underlying polymer thin film. The polymer thin film may eventually be nanostructured, too, in order to create a hierarchy in length scales. Grazing incidence X-ray scattering is an advanced method to characterize and investigate polymer–metal interfaces. Being non-destructive and yielding statistically relevant results, it allows for deducing the detailed polymer–metal interaction. We review the use of grazing incidence X-ray scattering to elucidate the polymer–metal interface, making use of the modern synchrotron radiation facilities, allowing for very local studies via in situ (so-called “stop-sputter”) experiments as well as studies observing the nanostructured metal nanoparticle layer growth in real time.

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Section: Combining Grazing Incidence X-ray Scattering and Sputter mentioning

confidence: 99%

Investigating Polymer–Metal Interfaces by Grazing Incidence Small-Angle X-Ray Scattering from Gradients to Real-Time Studies

Schwartzkopf

Roth

2016

Nanomaterials

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“…Scanning probe microscopy can supplement X-ray measurements by providing local structural information in real space. Inspired by this potential, several atomic force microscopes (AFM) [4][5][6][7][8][9] and scanning tunneling microscopes (STM) [10][11][12][13][14] have been installed on beamline end stations. In the AFM studies, it was shown that the AFM tip can be used to align the X-ray beam with features of interest [6] .…”

Section: Introductionmentioning

confidence: 99%

Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

et al. 2017

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A combined X-ray and scanning tunneling microscopy (STM) instrument is presented that enables the local detection of X-ray absorption on surfaces in a gas environment. To suppress the collection of ion currents generated in the gas phase, coaxially shielded STM tips were used. The conductive outer shield of the coaxial tips can be biased to deflect ions away from the tip core. When tunneling, the X-ray-induced current is separated from the regular, 'topographic' tunneling current using a novel high-speed separation scheme. We demonstrate the capabilities of the instrument by measuring the local X-ray-induced current on Au(1 1 1) in 800 mbar Ar.

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“…In order to overcome these limitations, groups around the world have been developing instruments that combine synchrotron radiation with the high spatial resolution of different SPM variants (Okuda et al, 2005;Saito et al, 2006;Scheler et al, 2009;Rose & Freeland, 2010a;Fauquet et al, 2011;Pilet et al, 2012;Chan et al, 2013;Suzuki, 2015;Slobodskyy et al, 2015). Recently, synchrotron X-ray scanning tunneling microscopy (SX-STM) showed the capability to obtain elemental contrast with a lateral spatial resolution of only 2 nm and sensitivity at the limit of single-atomic height (Shirato et al, 2014).…”

Section: Introductionmentioning

confidence: 99%

Local X-ray magnetic circular dichroism study of Fe/Cu(111) using a tunneling smart tip

DiLullo

Shirato

Cummings

et al. 2016

J Synchrotron Radiat

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Localized spectroscopy with simultaneous topographic, elemental and magnetic information is presented. A synchrotron X-ray scanning tunneling microscope has been employed for the local study of the X-ray magnetic circular dichroism at the FeL2,3-edges of a thin iron film grown on Cu(111). Polarization-dependent X-ray absorption spectra have been obtained through a tunneling smart tip that serves as a photoelectron detector. In contrast to conventional spin-polarized scanning tunneling microscopy, X-ray excitations provide magnetic contrast even with a non-magnetic tip. Intensity variations in the photoexcited tip current point to chemical variations within a single magnetic Fe domain.

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Versatile atomic force microscopy setup combined with micro-focused X-ray beam

Cited by 10 publications

References 18 publications

Investigating Polymer–Metal Interfaces by Grazing Incidence Small-Angle X-Ray Scattering from Gradients to Real-Time Studies

Investigating Polymer–Metal Interfaces by Grazing Incidence Small-Angle X-Ray Scattering from Gradients to Real-Time Studies

Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment

Local X-ray magnetic circular dichroism study of Fe/Cu(111) using a tunneling smart tip

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