1988
DOI: 10.1063/1.1139898
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Versatile apparatus for low-energy and hyperthermal energy ion scattering spectroscopies

Abstract: A source for producing alkali ion beams for lowenergy surface scattering spectroscopies Rev. Sci. Instrum. 60, 730 (1989); 10.1063/1.1141009 Apparatus for lowenergy ion scattering spectroscopies: Imaging angular distributions and collecting angle resolved energy spectra Rev. Sci. Instrum. 57, 433 (1986); 10.1063/1.1138905Ultrahigh vacuum apparatus for combined lowenergy electron diffraction, Auger spectroscopy, MeV ion scattering, and nuclear microanalysis Rev. Sci. Instrum. 53, 797 (1982);We have designed … Show more

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Cited by 35 publications
(10 citation statements)
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“…29 The data were obtained in a two-tiered, UHV chamber which has been described in detail elsewhere. 30 The upper tier is dedicated to the preparation of the sample surface and the lower tier is used for performing the ion scattering measurements. The upper tier contains a sputter gun, facilities for Auger electron spectroscopy ͑AES͒, and a set of reverseview low-energy electron diffraction ͑LEED͒ optics.…”
Section: Methodsmentioning
confidence: 99%
“…29 The data were obtained in a two-tiered, UHV chamber which has been described in detail elsewhere. 30 The upper tier is dedicated to the preparation of the sample surface and the lower tier is used for performing the ion scattering measurements. The upper tier contains a sputter gun, facilities for Auger electron spectroscopy ͑AES͒, and a set of reverseview low-energy electron diffraction ͑LEED͒ optics.…”
Section: Methodsmentioning
confidence: 99%
“…The scattering chamber and beam line have been described in detail elsewhere [17]. Typical The beam was incident along the (100) azimuth, with 8; = Hi = 45 .…”
mentioning
confidence: 99%
“…Our measurements were performed in an ultra high vacuum chamber and beamline that are described in detail elsewhere [15,16]. All of the ion beams were produced in a Colutron ion source that has been modified to allow highly efficient alkali ion beam production from a solid state source [17].…”
mentioning
confidence: 99%