Verification of CDM circuit simulation using an ESD evaluation circuit

Etherton, M.; Willemen, Joost; Wilkening, W.; Qu, Ningsong; Mettler, S.; Fichtner, W.

doi:10.1016/j.microrel.2006.11.006

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Verification of CDM circuit simulation using an ESD evaluation circuit

Cited by 3 publications

References 10 publications

A novel testing approach for full-chip CDM characterization

A novel testing approach for full-chip CDM characterization

A study of the effect of remote CDM clamps in integrated circuits

Charged Device Model Reliability of Three-Dimensional Integrated Circuits

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