Verification and diagnosis of digital systems by ternary reasoning

Wahba, Ayman; Einar, J.

doi:10.1007/bfb0021714

Cited by 4 publications

(2 citation statements)

References 13 publications

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“…Our diagnosis methodology is based on error hypotheses: an error type is assumed and the diagnosis is then made according to this assumption. If the error is not found, another type is assumed, and so on [9]. The diagnosis algorithm is valid under the following three assumptions:…”

Section: Definition 24 Boundary Of a Set Of Gatesmentioning

confidence: 99%

A method for automatic design error location and correction in combinational logic circuits

Wahba

Borrione

1996

J Electron Test

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Abstract. We present a new diagnostic algorithm, based on backward-propagation, for localising design errors in combinational logic circuits. Three hypotheses are considered, that cover all single gate replacement and insertion errors. Diagnosis-oriented test patterns are generated in order to rapidly reduce the suspected area where the error lies. The originality of our method is the use of patterns which do not detect the error, in addition to detecting patterns. A theorem shows that, in favourable cases, only two patterns suffice to get a correction. We have implemented the test generation and diagnosis algorithms. Results obtained on benchmarks show that the error is always found, after the application of a small number of test patterns, with an execution time proportional to the circuit size.

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Section: Definition 24 Boundary Of a Set Of Gatesmentioning

confidence: 99%

A method for automatic design error location and correction in combinational logic circuits

Wahba

Borrione

1996

J Electron Test

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“…Research in this area is very limited, and little has been published in this domain. Few automatic diagnosis systems are found in the literature, which are capable of diagnosing faults in combinational circuits only [1,2,3,4,5,6,7,8,9], but none of them could process sequential circuits.…”

Section: Introductionmentioning

confidence: 99%

Design error diagnosis in sequential circuits

Wahba

Borrione

1995

Lecture Notes in Computer Science

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We present a new diagnostic algorithm for localising design errors in sequential circuits. The specification and the implementation may have different number of state variables, and different state encoding. The algorithm is based on the new concept of possible next states describing the possible states of the circuit due to the existence of the error. Results obtained on benchmark circuits show that the error is always found, with an execution time proportional to the product of the circuit size, and the length of the test sequences used.

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Diagnosis and correction of multiple logic design errors in digital circuits

Chung

Hajj²

1997

IEEE Trans. VLSI Syst.

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This paper presents a technique to correct multiple logic design errors in a gate-level netlist. A number of methods have been proposed for correcting single logic design errors [1]-[10]. However, the extension of these methods to more than one error is still very limited. We direct our attention to circuits with a low multiplicity of errors. By assuming different error dependency scenarios, multiple errors are corrected by repeatedly applying the single error search and correction algorithm proposed in [7]. Experimental results on correcting doubledesign errors and triple-design errors on ISCAS and MCNC benchmark circuits are included.Index Terms-Design error, diagnosis, digital circuits, error correction.

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Verification and diagnosis of digital systems by ternary reasoning

Cited by 4 publications

References 13 publications

A method for automatic design error location and correction in combinational logic circuits

A method for automatic design error location and correction in combinational logic circuits

Design error diagnosis in sequential circuits

Diagnosis and correction of multiple logic design errors in digital circuits

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