“…The sample chamber was flushed with helium gas at a rate of 0.4 l/min, to which Ar was added on the way to the ICP-MS. Instrument background was measured for 30 s before each analysis, and the sample was measured for another 30 s. The masses Na 23 , Mg 25 , Al 27 , Si 29 , P 31 , K 39 , Ca 42 , Sc 45 , Ti 49 , V 51 , Mn 55 , Fe 57 , Rb 85 , Y 89 , Zr 90 , Nb 93 , Cs 133 , Ba 137 , La 139 , and Ce 140 were measured with a dwell time of 10 ms, whereas V 51 , Sm 147 , Dy 163 , Er 167 , Lu 175 , and Ta 181 were measured with a dwell time of 20 ms. Integrated signal intensities were referenced to NIST SRM 610 glass [40] according to routines described in Longerich et al [41].…”